X-ray photoelectron spectroscopy study of copper sodium silicate glass surfaces

  • A. Mekki
  • , D. Holland*
  • , C. F. McConville
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

51 Scopus citations

Abstract

Copper oxide-containing, sodium silicate glasses with composition (0.70-x)SiO2-0.30Na2O-xCuO (x in the range 0-0.2), were prepared by conventional melting and casting. The surface structure has been investigated by X-ray photoelectron spectroscopy. Evidence for the presence of copper in the Cu+ state for glasses with x ≤ 0.14, and for both oxidation states (Cu+ and Cu2+) in the glass where x = 0.18, has been obtained from the "shake up" satellite structure of the Cu 2p core level spectra. A deconvolution procedure has been undertaken to determine quantitatively the [Cu2+]/[Cutotal] ratio. The non-bridging oxygen content, obtained from the deconvolution of the O 1s core level spectra, increases with increasing copper oxide content indicating that copper acts as a network modifier. The O 1s spectra were modelled in such a way as to separate the contributions from SiOCu and SiONa to the non-bridging oxygen signal.

Original languageEnglish
Pages (from-to)271-282
Number of pages12
JournalJournal of Non-Crystalline Solids
Volume215
Issue number2-3
DOIs
StatePublished - Jul 1997

Bibliographical note

Funding Information:
One of us (A.M.) would like to acknowledge the support of King Fahd University of Petroleum and Minerals (KFUPM) and the Physics Department of KFUPM.

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

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