Work function at the tips of multiwalled carbon nanotubes

Ruiping Gao; Zhengwei Pan; Zhong L. Wang

doi:10.1063/1.1356442

Work function at the tips of multiwalled carbon nanotubes

Ruiping Gao
, Zhengwei Pan
, Zhong L. Wang^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

251 Scopus citations

Abstract

The work function at the tips of individual multiwalled carbon nanotubes has been measured by an in situ transmission electron microscopy technique. The tip work function shows no significant dependence on the diameter of the nanotubes in the range of 14-55 nm. Majority of the nanotubes have a work function of 4.6-4.8 eV at the tips, which is 0.2-0.4 eV lower than that of carbon. A small fraction of the nanotubes have a work function of ∼5.6 eV, about 0.6 eV higher than that of carbon. This discrepancy is suggested due to the metallic and semiconductive characteristics of the nanotube.

Original language	English
Pages (from-to)	1757-1759
Number of pages	3
Journal	Applied Physics Letters
Volume	78
Issue number	12
DOIs	https://doi.org/10.1063/1.1356442
State	Published - 19 Mar 2001
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Work function at the tips of multiwalled carbon nanotubes",

abstract = "The work function at the tips of individual multiwalled carbon nanotubes has been measured by an in situ transmission electron microscopy technique. The tip work function shows no significant dependence on the diameter of the nanotubes in the range of 14-55 nm. Majority of the nanotubes have a work function of 4.6-4.8 eV at the tips, which is 0.2-0.4 eV lower than that of carbon. A small fraction of the nanotubes have a work function of ∼5.6 eV, about 0.6 eV higher than that of carbon. This discrepancy is suggested due to the metallic and semiconductive characteristics of the nanotube.",

author = "Ruiping Gao and Zhengwei Pan and Wang, \{Zhong L.\}",

year = "2001",

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AU - Gao, Ruiping

AU - Pan, Zhengwei

AU - Wang, Zhong L.

PY - 2001/3/19

Y1 - 2001/3/19

N2 - The work function at the tips of individual multiwalled carbon nanotubes has been measured by an in situ transmission electron microscopy technique. The tip work function shows no significant dependence on the diameter of the nanotubes in the range of 14-55 nm. Majority of the nanotubes have a work function of 4.6-4.8 eV at the tips, which is 0.2-0.4 eV lower than that of carbon. A small fraction of the nanotubes have a work function of ∼5.6 eV, about 0.6 eV higher than that of carbon. This discrepancy is suggested due to the metallic and semiconductive characteristics of the nanotube.

AB - The work function at the tips of individual multiwalled carbon nanotubes has been measured by an in situ transmission electron microscopy technique. The tip work function shows no significant dependence on the diameter of the nanotubes in the range of 14-55 nm. Majority of the nanotubes have a work function of 4.6-4.8 eV at the tips, which is 0.2-0.4 eV lower than that of carbon. A small fraction of the nanotubes have a work function of ∼5.6 eV, about 0.6 eV higher than that of carbon. This discrepancy is suggested due to the metallic and semiconductive characteristics of the nanotube.

UR - https://www.scopus.com/pages/publications/0035911338

U2 - 10.1063/1.1356442

DO - 10.1063/1.1356442

M3 - Article

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SP - 1757

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JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 12

ER -

Work function at the tips of multiwalled carbon nanotubes

Abstract

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