Valence band anti-crossing analysis of dilute sulfur in ZnO l-x S x alloys

  • Saad M. Alqahtani
  • , Shaikh S. Ahmed

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

ZnO and related alloys are promising materials for application in photonics, electronics, piezoelectric nanogenerators and electromechanical devices. In this work, a Valence Band Anti-Crossing (VBAC) model is developed to analyze the energy bandgap of ZnO binary compound when it is lightly alloyed with anion sulfur (S) material. Minority anion alloy ZnO l-x S x exhibits unusual bowing of energy bandgap compared to cation alloying. The energy bandgap decreases dramatically from 3.37 eV to approximately 2.65 eV as the S composition increases to 100%. The main reason of the energy bandgap reduction is found to be the increase (up-shift) of the valence band edge (VBE) due to interaction between ZnO's extended VBE and the localized S defect energy state. The VBE of ZnO host material spilt into two sub-bands, the upper band E-and the lower band E+, when the S atoms replace the O atoms. The overall computational model is based on a coupling of the Hamiltonian of the supercell based on a fully-atomistic 8-band Sp 3 tight-binding basis set including spin orbital interaction and the Valence Force-Field (VFF) model using Keating potentials for strain calculations.

Original languageEnglish
Title of host publication2018 IEEE 13th Nanotechnology Materials and Devices Conference, NMDC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538610169
DOIs
StatePublished - 8 Jan 2019
Externally publishedYes

Publication series

Name2018 IEEE 13th Nanotechnology Materials and Devices Conference, NMDC 2018

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

Keywords

  • atomistic tight-binding
  • band anti-crossing
  • unusual bowing
  • valence band edge
  • valence force-field

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Surfaces, Coatings and Films
  • Instrumentation

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