Abstract
The effectiveness of Simulation Program with Integrated Circuit Emphasis (SPICE) in calculating probabilities, reliability, steady-state availability and mean-time to failure of redundant systems with non-repairable units and common-cause failures described by Markov models is demonstrated. General equations and procedure for constructing the equivalent circuit for N parallel units are presented. Results obtained, for N = 1, 2, 3, using SPICE are compared with previously published results obtained using the Laplace transform method. Full SPICE listings are included.
| Original language | English |
|---|---|
| Pages (from-to) | 235-255 |
| Number of pages | 21 |
| Journal | Active and Passive Electronic Components |
| Volume | 22 |
| Issue number | 4 |
| DOIs | |
| State | Published - 2000 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering