Using a new patent based technology indicator to measure the pace of technological progress for superconductor and semiconductor technologies

A. Kayal

doi:10.1109/PICMET.1997.653299

Using a new patent based technology indicator to measure the pace of technological progress for superconductor and semiconductor technologies

A. Kayal^*

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

This study used the technology cycle time indicator (TCT) to measure the pace of technological progress in superconductor and semiconductor technologies, then to demonstrate its validity, compared it with the real cycles of technological progress described by the technology experts. The study also used the TCT to assess the positions of various countries patenting in the semiconductor technology field, then checked how the TCT assessment corresponded with the experts' assessments. The findings revealed that the TCT provided good assessment in each situation.

Original language	English
Title of host publication	Innovation in Technology Management - The Key to Global Leadership, PICMET 1997
Subtitle of host publication	Portland International Conference on Management and Technology
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	149-153
Number of pages	5
ISBN (Electronic)	0780335740, 9780780335745
DOIs	https://doi.org/10.1109/PICMET.1997.653299
State	Published - 1997

Publication series

Name	Innovation in Technology Management - The Key to Global Leadership, PICMET 1997: Portland International Conference on Management and Technology

Bibliographical note

Publisher Copyright:
© 1997 PICMET.

ASJC Scopus subject areas

Management of Technology and Innovation
Strategy and Management

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/PICMET.1997.653299

Cite this

Kayal, A. (1997). Using a new patent based technology indicator to measure the pace of technological progress for superconductor and semiconductor technologies. In Innovation in Technology Management - The Key to Global Leadership, PICMET 1997: Portland International Conference on Management and Technology (pp. 149-153). Article 653299 (Innovation in Technology Management - The Key to Global Leadership, PICMET 1997: Portland International Conference on Management and Technology). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PICMET.1997.653299

Kayal, A. / Using a new patent based technology indicator to measure the pace of technological progress for superconductor and semiconductor technologies. Innovation in Technology Management - The Key to Global Leadership, PICMET 1997: Portland International Conference on Management and Technology. Institute of Electrical and Electronics Engineers Inc., 1997. pp. 149-153 (Innovation in Technology Management - The Key to Global Leadership, PICMET 1997: Portland International Conference on Management and Technology).

@inproceedings{25c205d623bd474daa9544547727ecbd,

title = "Using a new patent based technology indicator to measure the pace of technological progress for superconductor and semiconductor technologies",

abstract = "This study used the technology cycle time indicator (TCT) to measure the pace of technological progress in superconductor and semiconductor technologies, then to demonstrate its validity, compared it with the real cycles of technological progress described by the technology experts. The study also used the TCT to assess the positions of various countries patenting in the semiconductor technology field, then checked how the TCT assessment corresponded with the experts' assessments. The findings revealed that the TCT provided good assessment in each situation.",

author = "A. Kayal",

note = "Publisher Copyright: {\textcopyright} 1997 PICMET.",

year = "1997",

doi = "10.1109/PICMET.1997.653299",

language = "English",

series = "Innovation in Technology Management - The Key to Global Leadership, PICMET 1997: Portland International Conference on Management and Technology",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "149--153",

booktitle = "Innovation in Technology Management - The Key to Global Leadership, PICMET 1997",

address = "United States",

}

Kayal, A 1997, Using a new patent based technology indicator to measure the pace of technological progress for superconductor and semiconductor technologies. in Innovation in Technology Management - The Key to Global Leadership, PICMET 1997: Portland International Conference on Management and Technology., 653299, Innovation in Technology Management - The Key to Global Leadership, PICMET 1997: Portland International Conference on Management and Technology, Institute of Electrical and Electronics Engineers Inc., pp. 149-153. https://doi.org/10.1109/PICMET.1997.653299

Using a new patent based technology indicator to measure the pace of technological progress for superconductor and semiconductor technologies. / Kayal, A.
Innovation in Technology Management - The Key to Global Leadership, PICMET 1997: Portland International Conference on Management and Technology. Institute of Electrical and Electronics Engineers Inc., 1997. p. 149-153 653299 (Innovation in Technology Management - The Key to Global Leadership, PICMET 1997: Portland International Conference on Management and Technology).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Using a new patent based technology indicator to measure the pace of technological progress for superconductor and semiconductor technologies

AU - Kayal, A.

PY - 1997

Y1 - 1997

N2 - This study used the technology cycle time indicator (TCT) to measure the pace of technological progress in superconductor and semiconductor technologies, then to demonstrate its validity, compared it with the real cycles of technological progress described by the technology experts. The study also used the TCT to assess the positions of various countries patenting in the semiconductor technology field, then checked how the TCT assessment corresponded with the experts' assessments. The findings revealed that the TCT provided good assessment in each situation.

AB - This study used the technology cycle time indicator (TCT) to measure the pace of technological progress in superconductor and semiconductor technologies, then to demonstrate its validity, compared it with the real cycles of technological progress described by the technology experts. The study also used the TCT to assess the positions of various countries patenting in the semiconductor technology field, then checked how the TCT assessment corresponded with the experts' assessments. The findings revealed that the TCT provided good assessment in each situation.

UR - http://www.scopus.com/inward/record.url?scp=33744775730&partnerID=8YFLogxK

U2 - 10.1109/PICMET.1997.653299

DO - 10.1109/PICMET.1997.653299

M3 - Conference contribution

AN - SCOPUS:33744775730

T3 - Innovation in Technology Management - The Key to Global Leadership, PICMET 1997: Portland International Conference on Management and Technology

SP - 149

EP - 153

BT - Innovation in Technology Management - The Key to Global Leadership, PICMET 1997

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

Kayal A. Using a new patent based technology indicator to measure the pace of technological progress for superconductor and semiconductor technologies. In Innovation in Technology Management - The Key to Global Leadership, PICMET 1997: Portland International Conference on Management and Technology. Institute of Electrical and Electronics Engineers Inc. 1997. p. 149-153. 653299. (Innovation in Technology Management - The Key to Global Leadership, PICMET 1997: Portland International Conference on Management and Technology). doi: 10.1109/PICMET.1997.653299

Using a new patent based technology indicator to measure the pace of technological progress for superconductor and semiconductor technologies

Abstract

Publication series

Bibliographical note

ASJC Scopus subject areas

UN SDGs

Access to Document

Fingerprint

Cite this