Understanding nanomechanical and surface ellipsometry of optical F-doped SnO2 thin films by in-line APCVD
- Mohammad Afzaal*
- , Heather M. Yates
- , Amir Al-Ahmed
- , Anwar Ul-Hamid
- , Billel Salhi
- , Murad Ali
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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