Abstract
A transmitarray far-field beam scanning performance is illustrated based on the behavior of its focal region fields. It is shown that the oblique incidence of a plane wave on a transmitarray surface, forces the near-field focal point to shift mainly laterally with respect to the transmitarray surface. This behavior is shown useful in investigating a transmitarray far-field beam scanning. A beam scanning of 30 degrees is shown possible with no more than 1dBi gain loss.
Original language | English |
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Title of host publication | 2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, IEEECONF 2020 - Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 475-476 |
Number of pages | 2 |
ISBN (Electronic) | 9781728166704 |
DOIs | |
State | Published - 5 Jul 2020 |
Publication series
Name | 2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, IEEECONF 2020 - Proceedings |
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Bibliographical note
Publisher Copyright:© 2020 IEEE.
Keywords
- far-field beam scanning
- focal point shift
- receive-mode analysis
- transmitarrays
ASJC Scopus subject areas
- Computer Networks and Communications
- Instrumentation