Transistor stuck-open fault detection in multilevel CMOS circuits

Mostafa Abd-El-Barr; Yanging Xu; Carl McCrosky

Transistor stuck-open fault detection in multilevel CMOS circuits

Mostafa Abd-El-Barr^*, Yanging Xu, Carl McCrosky

^*Corresponding author for this work

King Fahd University of Petroleum & Minerals

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

The necessary and sufficient conditions for detecting transistor stuck-open faults in arbitrary multi-level CMOS circuits are shown. A method for representing a two-pattern test for detecting a single stuck-open fault using only one cube is presented. The relationship between the D-algorithm and the conditions for detecting transistor stuck-open faults in CMOS circuits is provided. The application of the proposed approach in robust test generation for transistor stuck-open faults in a number of benchmark circuits is demonstrated. The fault coverage achieved is as good as or better than those reported using existing techniques.

Original language	English
Title of host publication	Proceedings of the IEEE Great Lakes Symposium on VLSI
Publisher	IEEE
Pages	388-391
Number of pages	4
ISBN (Print)	0769501044
State	Published - 1999

Publication series

Name	Proceedings of the IEEE Great Lakes Symposium on VLSI
ISSN (Print)	1066-1395

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

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title = "Transistor stuck-open fault detection in multilevel CMOS circuits",

abstract = "The necessary and sufficient conditions for detecting transistor stuck-open faults in arbitrary multi-level CMOS circuits are shown. A method for representing a two-pattern test for detecting a single stuck-open fault using only one cube is presented. The relationship between the D-algorithm and the conditions for detecting transistor stuck-open faults in CMOS circuits is provided. The application of the proposed approach in robust test generation for transistor stuck-open faults in a number of benchmark circuits is demonstrated. The fault coverage achieved is as good as or better than those reported using existing techniques.",

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AU - Abd-El-Barr, Mostafa

AU - Xu, Yanging

AU - McCrosky, Carl

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N2 - The necessary and sufficient conditions for detecting transistor stuck-open faults in arbitrary multi-level CMOS circuits are shown. A method for representing a two-pattern test for detecting a single stuck-open fault using only one cube is presented. The relationship between the D-algorithm and the conditions for detecting transistor stuck-open faults in CMOS circuits is provided. The application of the proposed approach in robust test generation for transistor stuck-open faults in a number of benchmark circuits is demonstrated. The fault coverage achieved is as good as or better than those reported using existing techniques.

AB - The necessary and sufficient conditions for detecting transistor stuck-open faults in arbitrary multi-level CMOS circuits are shown. A method for representing a two-pattern test for detecting a single stuck-open fault using only one cube is presented. The relationship between the D-algorithm and the conditions for detecting transistor stuck-open faults in CMOS circuits is provided. The application of the proposed approach in robust test generation for transistor stuck-open faults in a number of benchmark circuits is demonstrated. The fault coverage achieved is as good as or better than those reported using existing techniques.

UR - http://www.scopus.com/inward/record.url?scp=0033329662&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0033329662

SN - 0769501044

T3 - Proceedings of the IEEE Great Lakes Symposium on VLSI

SP - 388

EP - 391

BT - Proceedings of the IEEE Great Lakes Symposium on VLSI

PB - IEEE

ER -

Transistor stuck-open fault detection in multilevel CMOS circuits

Abstract

Publication series

ASJC Scopus subject areas

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