Transistor-level based defect-tolerance for reliable nanoelectronics

Aiman H. El-Maleh, Bashir M. Al-Hashimi, Aissa Melouki, Ahmad Al-Yamani

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations


Nanodevices based circuit design will be based on the acceptance that a high percentage of devices in the design will be defective. A promising defect tolerance approach is one combining expensive but reliable gates with cheap but unreliable gates. One approach for increasing reliability of gates is by adding redundancy at the transistor-level implementation. In this chapter, we investigate a defect tolerant technique that adds redundancy at the transistor level and provides built-in immunity to permanent defects (stuck-open, stuck-short and bridges). The proposed technique is based on replacing each transistor by a quadded-transistor structure that guarantees defect tolerance of all single defects and a large number of multiple defects as validated by theoretical analysis and simulation. As demonstrated by extensive simulation results using ISCAS 85 and 89 benchmark circuits, the investigated technique achieves significantly higher defect tolerance than recently reported nanoelectronics defect-tolerant techniques (even with up to four to five times more transistor defect probability) and at reduced area overhead. The proposed approach can be effective in enhancing the reliability of Triple-modular- redundancy based defect tolerance approaches by enhancing the reliability of voter gates implementation.

Original languageEnglish
Title of host publicationRobust Computing with Nano-scale Devices - Progresses and Challenges
EditorsChao Huang
Number of pages21
StatePublished - 2010

Publication series

NameLecture Notes in Electrical Engineering
Volume58 LNEE
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119

Bibliographical note

Funding Information:
This work is supported by King Fahd University of Petroleum & Minerals under project COE/Nanoscale/388 for Dr. El-Maleh and Dr. Al-Yamani. It is also funded in part by the EPSRC/UK grant no. EP.E035965/1/for Prof. AL-Hashimi. The authors would like to thank Mr. Nadjib Mammeri for his help in this work.


  • Defect tolerance
  • Failure rate
  • Fault tolerance
  • Nanotechnology
  • Reliability

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering


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