Towards a test definition language for integrated circuits

Mohammad Alshayeb*, Muhammad E.S. Elrabaa, Ayman Hroub, Amran Al-Aghbari, Aiman H. El-Maleh, Abdelhafid Bouhraoua

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


The Standard Test Interface Language (STIL) is the de-facto standard for transferring test data between the test generation environment and the test equipment. STIL's fiexibility and extensibility facilitates its use as the sole input language for automatic test-pattern generation (ATPG). However, STIL format is complex and does not provide support for algorithmic interactive testing which necessitate the use of additional programming languages to do that. In this paper, we propose a new Test Definition Language for Integrated Circuits (TDLIC) based on the Extensible Markup Language (XML). TDLIC is a description language for defining tests of digital ICs in a precise and reusable form. The proposed TDLIC provides a common platform for specifying test data as well as complex test procedures. A case study that includes a validation platform is used to show the full capabilities of TDLIC. The validation platform is an FPGA-based system that emulates the automatic test equipment and a prototype IC with four circuits to be tested.

Original languageEnglish
Article number1550027
JournalJournal of Circuits, Systems and Computers
Issue number3
StatePublished - 1 Mar 2015

Bibliographical note

Funding Information:
This work was supported by King Abdulaziz City for Science and Technology through development grant 4-14/2010. Also, facilities support by King Fahd University of Petroleum and Minerals is highly appreciated by the authors.

Publisher Copyright:
© World Scientific Publishing Company.


  • Test description language
  • XML
  • integrated circuits testing

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering


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