TOF-SIMS characterization of impurity enrichment and redistribution in solid oxide electrolysis cells during operation
- Ragnar Kiebach*
- , Kion Norrman
- , Christodoulos Chatzichristodoulou
- , Ming Chen
- , Xiufu Sun
- , Sune D. Ebbesen
- , Mogens B. Mogensen
- , Peter Vang Hendriksen
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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