Abstract
A method in which the refractive index and thickness of a transparent film are determined simultaneously from measurements of transmittance at normal incidence is presented. This has been applied successfully to films of Ta 2O5.
| Original language | English |
|---|---|
| Article number | 003 |
| Pages (from-to) | 1939-1943 |
| Number of pages | 5 |
| Journal | Journal of Physics D: Applied Physics |
| Volume | 9 |
| Issue number | 14 |
| DOIs | |
| State | Published - 1976 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Acoustics and Ultrasonics
- Surfaces, Coatings and Films