Test data compression based on geometric shapes

Aiman El-Maleh*, Saif Al Zahir, Esam Khan

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

10 Scopus citations


The increasing complexity of systems-on-a-chip with the accompanied increase in their test data size has made the need for test data reduction imperative. In this paper, we introduce a novel and efficient test-independent compression technique based on geometric shapes. The technique exploits reordering of test vectors to minimize the number of shapes needed to encode the test data. The test set is partitioned into blocks and then each block is encoded separately. The encoder has the choice of encoding either the 0's or the 1's in a block. In addition, it encodes a block that contains only 0's (or 1's) and x's with only 3 bits. Furthermore, if the cost of encoding a block using geometric shapes is higher than the original cost of the block, the block is stored as is without encoding. The effectiveness of the technique in achieving high compression ratio is demonstrated on the largest full-scanned versions of ISCAS89 benchmark circuits. The proposed technique achieves significantly higher compression in comparison to other test-independent compression techniques reported in the literature.

Original languageEnglish
Pages (from-to)376-391
Number of pages16
JournalComputers and Electrical Engineering
Issue number3
StatePublished - May 2011

Bibliographical note

Funding Information:
This work is supported by King Fahd University of Petroleum & Minerals under project FT2000/07 . The authors would also like to thank Dr. Alaa El-Din Amin for his valuable comments on the hardware implementation of the decoder.

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Computer Science (all)
  • Electrical and Electronic Engineering


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