Terahertz detection using spectral domain interferometry

  • Gargi Sharma
  • , Kanwarpal Singh
  • , Ibraheem Al-Naib
  • , Roberto Morandotti
  • , Tsuneyuki Ozaki*
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

35 Scopus citations

Abstract

In this work, we present a novel method based on spectral domain interferometry for the electro-optic (EO) sampling of terahertz (THz) electric fields. This technique allows the use of thick crystals without the drawback of the overrotation that may occur with intense THz sources, allowing longer temporal scans and thus, better spectral resolution. Using this technique, a phase difference of approximately 8898π can be measured, which is 18,000 times larger than the phase difference that could be measured using EO sampling.

Original languageEnglish
Pages (from-to)4338-4340
Number of pages3
JournalOptics Letters
Volume37
Issue number20
DOIs
StatePublished - 15 Oct 2012
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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