TY - GEN
T1 - Systematic scan reconfiguration
AU - Al-Yamani, Ahmad A.
AU - Devta-Prasanna, Narendra
AU - Gunda, Arun
PY - 2007
Y1 - 2007
N2 - We present a new test data compression technique that achieves 10x to 40x compression ratios without requiring any information from the ATPG tool about the unspecified bits. The technique is applied to both single-stuck as well as transition fault test sets. The technique allows aggressive parallelization of scan chains leading to similar reduction in test time. It also reduces tester pins requirements by similar ratios. The technique is implemented using a hardware overhead of a few gates per scan chain.
AB - We present a new test data compression technique that achieves 10x to 40x compression ratios without requiring any information from the ATPG tool about the unspecified bits. The technique is applied to both single-stuck as well as transition fault test sets. The technique allows aggressive parallelization of scan chains leading to similar reduction in test time. It also reduces tester pins requirements by similar ratios. The technique is implemented using a hardware overhead of a few gates per scan chain.
UR - http://www.scopus.com/inward/record.url?scp=46649104480&partnerID=8YFLogxK
U2 - 10.1109/ASPDAC.2007.358075
DO - 10.1109/ASPDAC.2007.358075
M3 - Conference contribution
AN - SCOPUS:46649104480
SN - 1424406293
SN - 9781424406296
T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
SP - 738
EP - 743
BT - Proceedings of the ASP-DAC 2007 - Asia and South Pacific Design Automation Conference 2007
ER -