System Identification and Yaw Control of an Inspection Class ROV

Ahsan Tanveer*, S. M. Ahmad

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This work describes the design and real-time implementation of a yaw controller for a custom-built underwater vehicle. As opposed to the traditional mathematical-based modeling methodology, system identification approach is used for the purpose of dynamic characterization of the ROV. A proportional-integral controller is developed based on the resultant vehicle model. A unique root-locus approach is used for controller tuning. The proposed technique aids in analyzing the impact of simultaneous change in more than one parameter on the response of the system. Simulations followed by real-time experiments in pool settings demonstrate the effectiveness of the modeling and proposed control scheme employed.

Original languageEnglish
Title of host publicationProceedings of 2022 19th International Bhurban Conference on Applied Sciences and Technology, IBCAST 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages899-904
Number of pages6
ISBN (Electronic)9781665460514
DOIs
StatePublished - 2022
Externally publishedYes
Event19th International Bhurban Conference on Applied Sciences and Technology, IBCAST 2022 - Islamabad, Pakistan
Duration: 16 Aug 202220 Aug 2022

Publication series

NameProceedings of 2022 19th International Bhurban Conference on Applied Sciences and Technology, IBCAST 2022

Conference

Conference19th International Bhurban Conference on Applied Sciences and Technology, IBCAST 2022
Country/TerritoryPakistan
CityIslamabad
Period16/08/2220/08/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

Keywords

  • Dynamic modeling
  • ROV
  • novel root-locus
  • proportional-integral controller
  • system identification

ASJC Scopus subject areas

  • Aerospace Engineering
  • Civil and Structural Engineering
  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials
  • Metals and Alloys
  • Surfaces, Coatings and Films

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