Surface-related properties of perovskite CH3NH3PbI3 thin films by aerosol-assisted chemical vapour deposition

M. Afzaal; B. Salhi; A. Al-Ahmed; H. M. Yates; A. S. Hakeem

doi:10.1039/c7tc02968c

Surface-related properties of perovskite CH₃NH₃PbI₃ thin films by aerosol-assisted chemical vapour deposition

M. Afzaal^*, B. Salhi, A. Al-Ahmed, H. M. Yates, A. S. Hakeem

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

A modified three-step aerosol-assisted chemical vapour deposition process was used to grow dense and uniform CH₃NH₃PbI₃ thin films directly on borosilicate glass. The resulting photoluminescence spectrum was blue shifted with respect to its bandgap. X-ray photoelectron spectroscopy studies confirmed non-stoichiometric lead: iodine ratios within the films, due to decomposition of the CH₃NH₃PbI₃ layers over time into lead iodide and the release of ammonia and hydrogen iodide. The complex refractive index and dielectric function of the deposited thin films were determined by variable angle spectroscopic ellipsometry.

Original language	English
Pages (from-to)	8366-8370
Number of pages	5
Journal	Journal of Materials Chemistry C
Volume	5
Issue number	33
DOIs	https://doi.org/10.1039/c7tc02968c
State	Published - 2017

Bibliographical note

Publisher Copyright:
© The Royal Society of Chemistry.

ASJC Scopus subject areas

General Chemistry
Materials Chemistry

Access to Document

10.1039/c7tc02968c

Cite this

@article{d5e4a542995648c18b969afa4e0ffc66,

title = "Surface-related properties of perovskite CH3NH3PbI3 thin films by aerosol-assisted chemical vapour deposition",

abstract = "A modified three-step aerosol-assisted chemical vapour deposition process was used to grow dense and uniform CH3NH3PbI3 thin films directly on borosilicate glass. The resulting photoluminescence spectrum was blue shifted with respect to its bandgap. X-ray photoelectron spectroscopy studies confirmed non-stoichiometric lead: iodine ratios within the films, due to decomposition of the CH3NH3PbI3 layers over time into lead iodide and the release of ammonia and hydrogen iodide. The complex refractive index and dielectric function of the deposited thin films were determined by variable angle spectroscopic ellipsometry.",

author = "M. Afzaal and B. Salhi and A. Al-Ahmed and Yates, {H. M.} and Hakeem, {A. S.}",

note = "Publisher Copyright: {\textcopyright} The Royal Society of Chemistry.",

year = "2017",

doi = "10.1039/c7tc02968c",

language = "English",

volume = "5",

pages = "8366--8370",

journal = "Journal of Materials Chemistry C",

issn = "2050-7534",

number = "33",

}

TY - JOUR

T1 - Surface-related properties of perovskite CH3NH3PbI3 thin films by aerosol-assisted chemical vapour deposition

AU - Afzaal, M.

AU - Salhi, B.

AU - Al-Ahmed, A.

AU - Yates, H. M.

AU - Hakeem, A. S.

PY - 2017

Y1 - 2017

N2 - A modified three-step aerosol-assisted chemical vapour deposition process was used to grow dense and uniform CH3NH3PbI3 thin films directly on borosilicate glass. The resulting photoluminescence spectrum was blue shifted with respect to its bandgap. X-ray photoelectron spectroscopy studies confirmed non-stoichiometric lead: iodine ratios within the films, due to decomposition of the CH3NH3PbI3 layers over time into lead iodide and the release of ammonia and hydrogen iodide. The complex refractive index and dielectric function of the deposited thin films were determined by variable angle spectroscopic ellipsometry.

AB - A modified three-step aerosol-assisted chemical vapour deposition process was used to grow dense and uniform CH3NH3PbI3 thin films directly on borosilicate glass. The resulting photoluminescence spectrum was blue shifted with respect to its bandgap. X-ray photoelectron spectroscopy studies confirmed non-stoichiometric lead: iodine ratios within the films, due to decomposition of the CH3NH3PbI3 layers over time into lead iodide and the release of ammonia and hydrogen iodide. The complex refractive index and dielectric function of the deposited thin films were determined by variable angle spectroscopic ellipsometry.

UR - http://www.scopus.com/inward/record.url?scp=85028396149&partnerID=8YFLogxK

U2 - 10.1039/c7tc02968c

DO - 10.1039/c7tc02968c

M3 - Article

AN - SCOPUS:85028396149

SN - 2050-7534

VL - 5

SP - 8366

EP - 8370

JO - Journal of Materials Chemistry C

JF - Journal of Materials Chemistry C

IS - 33

ER -