Study of the Lorentz-Lorenz law and the energy loss of 4He ions in titanium oxide films

E. E. Khawaja; F. Bouamrane; F. Al-Adel; A. B. Hallak; M. A. Daous; M. A. Salim

doi:10.1016/0040-6090(94)90708-0

Study of the Lorentz-Lorenz law and the energy loss of ⁴He ions in titanium oxide films

E. E. Khawaja^*, F. Bouamrane, F. Al-Adel, A. B. Hallak, M. A. Daous, M. A. Salim

^*Corresponding author for this work

King Fahd University of Petroleum & Minerals

Research output: Contribution to journal › Article › peer-review

29 Scopus citations

Abstract

The optical constants, thicknesses and densities of thin titanium oxide films, deposited by electron beam evaporation, were measured. The variation of the refractive index with the density, of titanium oxide samples in the form of thin films (present work) and bulk crystalline form (data from the literature), was observed to follow the Lorentz-Lorenz law. The molecular electronic polarizability deduced from the law was close (within the uncertainty in the measurement) to the value reported in the literature. Rutherford backscattering spectroscopy and X-ray photoelectron spectroscopy studies were carried out on the thin films.

Original language	English
Pages (from-to)	121-130
Number of pages	10
Journal	Thin Solid Films
Volume	240
Issue number	1-2
DOIs	https://doi.org/10.1016/0040-6090(94)90708-0
State	Published - 15 Mar 1994

Bibliographical note

Funding Information:
This work is part of King Fahd University of Petroleum and Minerals/Research Institute projects Laser Research Lab. and Tandetron Accelerator Lab. supported by the King Fahd University of Petroleum and Minerals.

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

Access to Document

10.1016/0040-6090(94)90708-0

Cite this

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title = "Study of the Lorentz-Lorenz law and the energy loss of 4He ions in titanium oxide films",

abstract = "The optical constants, thicknesses and densities of thin titanium oxide films, deposited by electron beam evaporation, were measured. The variation of the refractive index with the density, of titanium oxide samples in the form of thin films (present work) and bulk crystalline form (data from the literature), was observed to follow the Lorentz-Lorenz law. The molecular electronic polarizability deduced from the law was close (within the uncertainty in the measurement) to the value reported in the literature. Rutherford backscattering spectroscopy and X-ray photoelectron spectroscopy studies were carried out on the thin films.",

author = "Khawaja, \{E. E.\} and F. Bouamrane and F. Al-Adel and Hallak, \{A. B.\} and Daous, \{M. A.\} and Salim, \{M. A.\}",

note = "Funding Information: This work is part of King Fahd University of Petroleum and Minerals/Research Institute projects Laser Research Lab. and Tandetron Accelerator Lab. supported by the King Fahd University of Petroleum and Minerals.",

year = "1994",

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doi = "10.1016/0040-6090(94)90708-0",

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T1 - Study of the Lorentz-Lorenz law and the energy loss of 4He ions in titanium oxide films

AU - Khawaja, E. E.

AU - Bouamrane, F.

AU - Al-Adel, F.

AU - Hallak, A. B.

AU - Daous, M. A.

AU - Salim, M. A.

N1 - Funding Information: This work is part of King Fahd University of Petroleum and Minerals/Research Institute projects Laser Research Lab. and Tandetron Accelerator Lab. supported by the King Fahd University of Petroleum and Minerals.

PY - 1994/3/15

Y1 - 1994/3/15

N2 - The optical constants, thicknesses and densities of thin titanium oxide films, deposited by electron beam evaporation, were measured. The variation of the refractive index with the density, of titanium oxide samples in the form of thin films (present work) and bulk crystalline form (data from the literature), was observed to follow the Lorentz-Lorenz law. The molecular electronic polarizability deduced from the law was close (within the uncertainty in the measurement) to the value reported in the literature. Rutherford backscattering spectroscopy and X-ray photoelectron spectroscopy studies were carried out on the thin films.

AB - The optical constants, thicknesses and densities of thin titanium oxide films, deposited by electron beam evaporation, were measured. The variation of the refractive index with the density, of titanium oxide samples in the form of thin films (present work) and bulk crystalline form (data from the literature), was observed to follow the Lorentz-Lorenz law. The molecular electronic polarizability deduced from the law was close (within the uncertainty in the measurement) to the value reported in the literature. Rutherford backscattering spectroscopy and X-ray photoelectron spectroscopy studies were carried out on the thin films.

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