STUCK-TYPE FAULT DETECTION IN MULTI-VALUED COMBINATIONAL CIRCUITS.

Yousef Mohammed Ajabnoor; Mostafa Hassanin Abd-El barr

STUCK-TYPE FAULT DETECTION IN MULTI-VALUED COMBINATIONAL CIRCUITS.

Yousef Mohammed Ajabnoor^*, Mostafa Hassanin Abd-El barr

^*Corresponding author for this work

King Fahd University of Petroleum & Minerals

Research output: Contribution to journal › Conference article › peer-review

Abstract

A general method for generating the complete set of tests to detect all stuck-type faults in multi-valued 2-level combinational circuits is presented. Use has been made of the logic difference concept. Algorithms for generating the complete set of tests for both K-AND/OR and K-OR/AND configurations are also presented. The idea can be generalized to cover any multi-valued multi-level combinational circuits.

Original language	English
Pages (from-to)	275-282
Number of pages	8
Journal	Unknown Journal
State	Published - 1981

ASJC Scopus subject areas

General Computer Science
General Mathematics

Cite this

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title = "STUCK-TYPE FAULT DETECTION IN MULTI-VALUED COMBINATIONAL CIRCUITS.",

abstract = "A general method for generating the complete set of tests to detect all stuck-type faults in multi-valued 2-level combinational circuits is presented. Use has been made of the logic difference concept. Algorithms for generating the complete set of tests for both K-AND/OR and K-OR/AND configurations are also presented. The idea can be generalized to cover any multi-valued multi-level combinational circuits.",

author = "Ajabnoor, \{Yousef Mohammed\} and \{Abd-El barr\}, \{Mostafa Hassanin\}",

year = "1981",

language = "English",

pages = "275--282",

journal = "Unknown Journal",

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TY - JOUR

T1 - STUCK-TYPE FAULT DETECTION IN MULTI-VALUED COMBINATIONAL CIRCUITS.

AU - Ajabnoor, Yousef Mohammed

AU - Abd-El barr, Mostafa Hassanin

PY - 1981

Y1 - 1981

N2 - A general method for generating the complete set of tests to detect all stuck-type faults in multi-valued 2-level combinational circuits is presented. Use has been made of the logic difference concept. Algorithms for generating the complete set of tests for both K-AND/OR and K-OR/AND configurations are also presented. The idea can be generalized to cover any multi-valued multi-level combinational circuits.

AB - A general method for generating the complete set of tests to detect all stuck-type faults in multi-valued 2-level combinational circuits is presented. Use has been made of the logic difference concept. Algorithms for generating the complete set of tests for both K-AND/OR and K-OR/AND configurations are also presented. The idea can be generalized to cover any multi-valued multi-level combinational circuits.

UR - https://www.scopus.com/pages/publications/0019677831

M3 - Conference article

AN - SCOPUS:0019677831

SP - 275

EP - 282

JO - Unknown Journal

JF - Unknown Journal

ER -

STUCK-TYPE FAULT DETECTION IN MULTI-VALUED COMBINATIONAL CIRCUITS.

Abstract

ASJC Scopus subject areas

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