Abstract
We present here the structural and electrical properties of the thin films of V 2 O 3 (Vanadium sesquioxide) and V 5 O 9 . Both these oxide phases, V 2 O 3 and V 5 O 9 , have beenachieved on (001) orientedSi substrate using the V 2 O 5 target by optimizing the deposition parameters using pulsed laser deposition technique (PLD).Deposited films were characterized by X-ray diffraction(XRD)and four probe temperature dependent resistivity measurements. XRD studies reveal the V 2 O 3 and V 5 O 9 phases and the amount of strain present in both these films. The temperature dependency of electrical resistivity confirmed the characteristic metal-insulator transitions (MIT) for both the films, V 2 O 3 and V 5 O 9 .
| Original language | English |
|---|---|
| Title of host publication | Solid State Physics |
| Subtitle of host publication | Proceedings of the 59th DAE Solid State Physics Symposium 2014 |
| Editors | R. Chitra, N. K. Sahoo, Dibyendu Bhattacharyya |
| Publisher | American Institute of Physics Inc. |
| ISBN (Electronic) | 9780735413108 |
| DOIs | |
| State | Published - 24 Jun 2015 |
| Externally published | Yes |
| Event | 59th DAE Solid State Physics Symposium, SSPS 2014 - Vellore, Tamilnadu, India Duration: 16 Dec 2014 → 20 Dec 2014 |
Publication series
| Name | AIP Conference Proceedings |
|---|---|
| Volume | 1665 |
| ISSN (Print) | 0094-243X |
| ISSN (Electronic) | 1551-7616 |
Conference
| Conference | 59th DAE Solid State Physics Symposium, SSPS 2014 |
|---|---|
| Country/Territory | India |
| City | Vellore, Tamilnadu |
| Period | 16/12/14 → 20/12/14 |
Bibliographical note
Publisher Copyright:© 2015 AIP Publishing LLC.
ASJC Scopus subject areas
- General Physics and Astronomy
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