STM/AFM study of grain boundary migration in nanostructured solids

J. Y. Ying*, Wang Guang-Hou, H. Fuchs, R. Laschinski, H. Gleiter

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

31 Scopus citations

Abstract

Nanostructured materials were directly imaged by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Images suggested that nanostructured palladium (Pd) consisted of equiaxed crystals of ≈ 10 nm diameter joined together by grain boundaries. Migration of the grain boundaries in nanostructured Pd was stimulated by STM (but not AFM), resulting in a preferential alignment of the nanometer-sized grains.

Original languageEnglish
Pages (from-to)180-185
Number of pages6
JournalMaterials Letters
Volume15
Issue number3
DOIs
StatePublished - Nov 1992
Externally publishedYes

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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