TY - GEN
T1 - Statistical modeling of image degradation based on quality metrics
AU - Chetouani, Aladine
AU - Beghdadi, Azeddine
AU - Deriche, Mohamed
PY - 2010
Y1 - 2010
N2 - A plethora of Image Quality Metrics (IQM) has been proposed during the last two decades. However, at present time, there is no accepted IQM able to predict the perceptual level of image degradation across different types of visual distortions. Some measures are more adapted for a set of degradations but inefficient for others. Indeed, the efficiency of any IQM has been shown to depend upon the type of degradation. Thus, we propose here a new approach for predicting the type of degradation before using IQMs. The basic idea is first to identify the type of distortion using a Bayesian approach, then select the most appropriate IQM for estimating image quality for that specific type of distortion. The performance of the proposed method is evaluated in terms of classification accuracy across different types of degradations.
AB - A plethora of Image Quality Metrics (IQM) has been proposed during the last two decades. However, at present time, there is no accepted IQM able to predict the perceptual level of image degradation across different types of visual distortions. Some measures are more adapted for a set of degradations but inefficient for others. Indeed, the efficiency of any IQM has been shown to depend upon the type of degradation. Thus, we propose here a new approach for predicting the type of degradation before using IQMs. The basic idea is first to identify the type of distortion using a Bayesian approach, then select the most appropriate IQM for estimating image quality for that specific type of distortion. The performance of the proposed method is evaluated in terms of classification accuracy across different types of degradations.
UR - https://www.scopus.com/pages/publications/78149471647
U2 - 10.1109/ICPR.2010.180
DO - 10.1109/ICPR.2010.180
M3 - Conference contribution
AN - SCOPUS:78149471647
SN - 9780769541099
T3 - Proceedings - International Conference on Pattern Recognition
SP - 714
EP - 717
BT - Proceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010
ER -