Statistical analysis of multiple intermittent faults in combinational circuits

Mostafa H. Abd-El-Barr; Shad I. Ansari

doi:10.1080/002072196137093

Statistical analysis of multiple intermittent faults in combinational circuits

Mostafa H. Abd-El-Barr^*
, Shad I. Ansari

^*Corresponding author for this work

King Fahd University of Petroleum & Minerals

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Statistical analysis of multiple intermittent faults (SAMIFs) is proposed as a method for estimating the detection probabilities and fault coverage of multiple intermittent faults in combinational circuits. SAMIFs involves the concurrent simulation of multiple intermittent faults and an estimation of the controllability and observability values for each node of the faulty circuit for a given set of input vectors. The controllabilities and observabilities are then used to derive estimates of the fault-detection probabilities and the overall fault coverage. An algorithm for estimating the fault coverage of a pseudo-random test vector set over a set of multiple intermittent faults in a combinational circuit is also proposed. Experimental results obtained from applying the algorithm to a number of benchmark circuits are also presented.

Original language	English
Pages (from-to)	647-660
Number of pages	14
Journal	International Journal of Electronics
Volume	80
Issue number	5
DOIs	https://doi.org/10.1080/002072196137093
State	Published - 1 May 1996

Bibliographical note

Funding Information:
Theauthorswouldliketoacknowledgethe® nancialsupportoftheNational Sciences and Engineering Research Council of Canada (NSERC). They would also like to acknowledge the support of King Fahd University of Petroleum and Minerals.

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1080/002072196137093

Cite this

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title = "Statistical analysis of multiple intermittent faults in combinational circuits",

abstract = "Statistical analysis of multiple intermittent faults (SAMIFs) is proposed as a method for estimating the detection probabilities and fault coverage of multiple intermittent faults in combinational circuits. SAMIFs involves the concurrent simulation of multiple intermittent faults and an estimation of the controllability and observability values for each node of the faulty circuit for a given set of input vectors. The controllabilities and observabilities are then used to derive estimates of the fault-detection probabilities and the overall fault coverage. An algorithm for estimating the fault coverage of a pseudo-random test vector set over a set of multiple intermittent faults in a combinational circuit is also proposed. Experimental results obtained from applying the algorithm to a number of benchmark circuits are also presented.",

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AU - Ansari, Shad I.

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PY - 1996/5/1

Y1 - 1996/5/1

N2 - Statistical analysis of multiple intermittent faults (SAMIFs) is proposed as a method for estimating the detection probabilities and fault coverage of multiple intermittent faults in combinational circuits. SAMIFs involves the concurrent simulation of multiple intermittent faults and an estimation of the controllability and observability values for each node of the faulty circuit for a given set of input vectors. The controllabilities and observabilities are then used to derive estimates of the fault-detection probabilities and the overall fault coverage. An algorithm for estimating the fault coverage of a pseudo-random test vector set over a set of multiple intermittent faults in a combinational circuit is also proposed. Experimental results obtained from applying the algorithm to a number of benchmark circuits are also presented.

AB - Statistical analysis of multiple intermittent faults (SAMIFs) is proposed as a method for estimating the detection probabilities and fault coverage of multiple intermittent faults in combinational circuits. SAMIFs involves the concurrent simulation of multiple intermittent faults and an estimation of the controllability and observability values for each node of the faulty circuit for a given set of input vectors. The controllabilities and observabilities are then used to derive estimates of the fault-detection probabilities and the overall fault coverage. An algorithm for estimating the fault coverage of a pseudo-random test vector set over a set of multiple intermittent faults in a combinational circuit is also proposed. Experimental results obtained from applying the algorithm to a number of benchmark circuits are also presented.

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Statistical analysis of multiple intermittent faults in combinational circuits

Abstract

Bibliographical note

ASJC Scopus subject areas

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