Spectroscopic, electrical and EPR studies of binary semiconducting oxide glasses containing 50 mol% V2O5

E. E. Khawaja*, M. Sakhawat Hussain, M. A. Khan, J. S. Hwang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

Recent measurements on the V2O5-GeO2 glass system consisting of an equimolar mixture of V2O5 and GeO2 revealed that increase in electrical conductivity of these glasses upon annealing could be attributed to the increase in V4+ and V3+ content which accompanied the microstructure formation. In the present work we report a similar study on V2O5-TeO2 and V2O5-P2O5 glass systems. It was found that in tellurite glass V3+ content increased upon annealing and V4+ content remained unchanged. In phosphate glass some increase in V4+ and no significant change in V3+ contents were observed. V3+ and V4+ contents in glasses could be best estimated from optical and electron paramagnetic resonance spectra, respectively.

Original languageEnglish
Pages (from-to)2812-2818
Number of pages7
JournalJournal of Materials Science
Volume21
Issue number8
DOIs
StatePublished - Aug 1986

ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Science (miscellaneous)
  • General Materials Science
  • Mechanics of Materials
  • Mechanical Engineering
  • Polymers and Plastics

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