Smart fault detection and classification for distribution grid hybridizing ST and MLP-NN

Abdulaziz Aljohani, Abdulrahman Aljurbua, Md Shafiullah, M. A. Abido*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

11 Scopus citations

Abstract

Power quality disturbances become a major issue in modern commercial distribution grids, hence an innovative attempt to diagnose the faults is necessary for optimal management of power distribution grids and associated assets. This paper presents a hybrid approach using Stockwell transform (ST) and multilayer perceptron neural network (MLP-NN) to detect, and classify the faults in a simulated IEEE 13-node test distribution feeder in Real Time Digital Simulator (RTDS). In the proposed technique, the three-phase current waveforms are measured from different points in the feeder and then processed using ST to extract useful statistical features. The features are later fed into the MLP-NN system to detect and classify the faults. The approach proved to be highly efficient in terms of accuracy under both noisy and non-noisy measurements. In addition, the proposed approach is independent of pre-fault operating conditions as well as fault resistance and inception angle.

Original languageEnglish
Title of host publication2018 15th International Multi-Conference on Systems, Signals and Devices, SSD 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages94-98
Number of pages5
ISBN (Electronic)9781538653050
DOIs
StatePublished - 7 Dec 2018

Publication series

Name2018 15th International Multi-Conference on Systems, Signals and Devices, SSD 2018

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

Keywords

  • Distribution grids
  • Fault classification
  • Fault detection
  • IEEE 13-node test distribution feeder
  • Multilayer perceptron neural network
  • Statistical features
  • Stockwell transform

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Signal Processing
  • Control and Optimization
  • Instrumentation

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