Simple method for determining the optical constants of thin metallic films from transmittance measurements

E. E. Khawaja; S. M.A. Durrani; A. M. Al-Shukri

doi:10.1016/S0040-6090(99)00689-6

Simple method for determining the optical constants of thin metallic films from transmittance measurements

E. E. Khawaja^*, S. M.A. Durrani, A. M. Al-Shukri

^*Corresponding author for this work

King Fahd University of Petroleum & Minerals

Research output: Contribution to journal › Article › peer-review

21 Scopus citations

Abstract

A method for the determination of the optical constants of thin metal films on transparent substrates is proposed. It requires measurements at normal incidence of the transmittance from the specimen itself and when coated with a thin transparent layer. A procedure is given for determining the correct solutions for the indices of refraction and absorption and also for accurately fixing the thickness of the film. Advantage of the present method over existing methods is readily available measurement facilities. The method has been applied successfully to films of gold.

Original language	English
Pages (from-to)	166-171
Number of pages	6
Journal	Thin Solid Films
Volume	358
Issue number	1
DOIs	https://doi.org/10.1016/S0040-6090(99)00689-6
State	Published - 10 Jan 2000

Bibliographical note

Funding Information:
This work is part of an internal project # CAPS1202, supported by the Research Institute of King Fahd University of Petroleum and Minerals.

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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10.1016/S0040-6090(99)00689-6

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title = "Simple method for determining the optical constants of thin metallic films from transmittance measurements",

abstract = "A method for the determination of the optical constants of thin metal films on transparent substrates is proposed. It requires measurements at normal incidence of the transmittance from the specimen itself and when coated with a thin transparent layer. A procedure is given for determining the correct solutions for the indices of refraction and absorption and also for accurately fixing the thickness of the film. Advantage of the present method over existing methods is readily available measurement facilities. The method has been applied successfully to films of gold.",

author = "Khawaja, \{E. E.\} and Durrani, \{S. M.A.\} and Al-Shukri, \{A. M.\}",

note = "Funding Information: This work is part of an internal project \# CAPS1202, supported by the Research Institute of King Fahd University of Petroleum and Minerals. ",

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AU - Khawaja, E. E.

AU - Durrani, S. M.A.

AU - Al-Shukri, A. M.

N1 - Funding Information: This work is part of an internal project # CAPS1202, supported by the Research Institute of King Fahd University of Petroleum and Minerals.

PY - 2000/1/10

Y1 - 2000/1/10

N2 - A method for the determination of the optical constants of thin metal films on transparent substrates is proposed. It requires measurements at normal incidence of the transmittance from the specimen itself and when coated with a thin transparent layer. A procedure is given for determining the correct solutions for the indices of refraction and absorption and also for accurately fixing the thickness of the film. Advantage of the present method over existing methods is readily available measurement facilities. The method has been applied successfully to films of gold.

AB - A method for the determination of the optical constants of thin metal films on transparent substrates is proposed. It requires measurements at normal incidence of the transmittance from the specimen itself and when coated with a thin transparent layer. A procedure is given for determining the correct solutions for the indices of refraction and absorption and also for accurately fixing the thickness of the film. Advantage of the present method over existing methods is readily available measurement facilities. The method has been applied successfully to films of gold.

UR - https://www.scopus.com/pages/publications/0033883339

U2 - 10.1016/S0040-6090(99)00689-6

DO - 10.1016/S0040-6090(99)00689-6

M3 - Article

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SN - 0040-6090

VL - 358

SP - 166

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JO - Thin Solid Films

JF - Thin Solid Films

IS - 1

ER -

Simple method for determining the optical constants of thin metallic films from transmittance measurements

Abstract

Bibliographical note

ASJC Scopus subject areas

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