Scanning force microscopy of surface damage created by fast C60 cluster ions in CaF2 and LaF3 single crystals

A. S. El-Said; F. Aumayr; S. Della-Negra; R. Neumann; K. Schwartz; M. Toulemonde; C. Trautmann; K. O. Voss

doi:10.1016/j.nimb.2006.12.025

Scanning force microscopy of surface damage created by fast C₆₀ cluster ions in CaF₂ and LaF₃ single crystals

A. S. El-Said^*
, F. Aumayr
, S. Della-Negra
, R. Neumann
, K. Schwartz
, M. Toulemonde
, C. Trautmann
, K. O. Voss

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

Single crystals of CaF₂ and LaF₃ were exposed to 30-MeV C₆₀ clusters from the tandem accelerator in Orsay, extending earlier irradiation experiments with monoatomic swift heavy ions to larger energy loss values. The irradiated crystal surfaces were investigated by scanning force microscopy (SFM) in contact mode. Topographic images reveal nanometric hillock-like structures protruding from the surface at each cluster impact site. The hillock diameter and height are analyzed and compared to monoatomic projectiles.

Original language	English
Pages (from-to)	313-318
Number of pages	6
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	256
Issue number	1
DOIs	https://doi.org/10.1016/j.nimb.2006.12.025
State	Published - Mar 2007
Externally published	Yes

Bibliographical note

Funding Information:
A.S. El-Said gratefully acknowledges support from Austrian FWF (grant No. M894–N02)

Keywords

C clusters
CaF
Electronic energy loss
LaF
SFM

ASJC Scopus subject areas

Nuclear and High Energy Physics
Instrumentation

Access to Document

10.1016/j.nimb.2006.12.025

Cite this

El-Said, A. S., Aumayr, F., Della-Negra, S., Neumann, R., Schwartz, K., Toulemonde, M., Trautmann, C., & Voss, K. O. (2007). Scanning force microscopy of surface damage created by fast C₆₀ cluster ions in CaF₂ and LaF₃ single crystals. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 256(1), 313-318. https://doi.org/10.1016/j.nimb.2006.12.025

@article{86f9aab06f404729a8d442165190ecaa,

title = "Scanning force microscopy of surface damage created by fast C60 cluster ions in CaF2 and LaF3 single crystals",

abstract = "Single crystals of CaF2 and LaF3 were exposed to 30-MeV C60 clusters from the tandem accelerator in Orsay, extending earlier irradiation experiments with monoatomic swift heavy ions to larger energy loss values. The irradiated crystal surfaces were investigated by scanning force microscopy (SFM) in contact mode. Topographic images reveal nanometric hillock-like structures protruding from the surface at each cluster impact site. The hillock diameter and height are analyzed and compared to monoatomic projectiles.",

keywords = "C clusters, CaF, Electronic energy loss, LaF, SFM",

author = "El-Said, \{A. S.\} and F. Aumayr and S. Della-Negra and R. Neumann and K. Schwartz and M. Toulemonde and C. Trautmann and Voss, \{K. O.\}",

note = "Funding Information: A.S. El-Said gratefully acknowledges support from Austrian FWF (grant No. M894–N02) ",

year = "2007",

month = mar,

doi = "10.1016/j.nimb.2006.12.025",

language = "English",

volume = "256",

pages = "313--318",

journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",

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number = "1",

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El-Said, AS, Aumayr, F, Della-Negra, S, Neumann, R, Schwartz, K, Toulemonde, M, Trautmann, C & Voss, KO 2007, 'Scanning force microscopy of surface damage created by fast C₆₀ cluster ions in CaF₂ and LaF₃ single crystals', Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, vol. 256, no. 1, pp. 313-318. https://doi.org/10.1016/j.nimb.2006.12.025

Scanning force microscopy of surface damage created by fast C₆₀ cluster ions in CaF₂ and LaF₃ single crystals. / El-Said, A. S.; Aumayr, F.; Della-Negra, S. et al.
In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 256, No. 1, 03.2007, p. 313-318.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Scanning force microscopy of surface damage created by fast C60 cluster ions in CaF2 and LaF3 single crystals

AU - El-Said, A. S.

AU - Aumayr, F.

AU - Della-Negra, S.

AU - Neumann, R.

AU - Schwartz, K.

AU - Toulemonde, M.

AU - Trautmann, C.

AU - Voss, K. O.

N1 - Funding Information: A.S. El-Said gratefully acknowledges support from Austrian FWF (grant No. M894–N02)

PY - 2007/3

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N2 - Single crystals of CaF2 and LaF3 were exposed to 30-MeV C60 clusters from the tandem accelerator in Orsay, extending earlier irradiation experiments with monoatomic swift heavy ions to larger energy loss values. The irradiated crystal surfaces were investigated by scanning force microscopy (SFM) in contact mode. Topographic images reveal nanometric hillock-like structures protruding from the surface at each cluster impact site. The hillock diameter and height are analyzed and compared to monoatomic projectiles.

AB - Single crystals of CaF2 and LaF3 were exposed to 30-MeV C60 clusters from the tandem accelerator in Orsay, extending earlier irradiation experiments with monoatomic swift heavy ions to larger energy loss values. The irradiated crystal surfaces were investigated by scanning force microscopy (SFM) in contact mode. Topographic images reveal nanometric hillock-like structures protruding from the surface at each cluster impact site. The hillock diameter and height are analyzed and compared to monoatomic projectiles.

KW - C clusters

KW - CaF

KW - Electronic energy loss

KW - LaF

KW - SFM

UR - https://www.scopus.com/pages/publications/33947119566

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DO - 10.1016/j.nimb.2006.12.025

M3 - Article

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JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

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