Rutherford backscattering spectroscopy and X-ray photoelectron spectroscopy studies of thin glass films prepared by laser evaporation

E. E. Khawaja*, F. F. Al-Adel, A. B. Hallak, M. M. Al-Kofahi, M. A. Salim

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

Multicomponent glass and laser-evaporated thin films prepared from the glass were studied by Rutherford backscattering spectroscopy (RBS) and X-ray photoelectron spectroscopy. The composition of the glass and the film as determined through RBS suggested that the films were deficient in oxygen. Furthermore, an increase in the reduced states of vanadium ions in going from the glass to the film was detected from the shift in the binding energy of the core level peak of V 2p and the development of a component peak in the V L3M23V Auger spectra. The reduction of vanadium could have possibly occurred because of the loss of oxygen during evaporation and thus would support the RBS results.

Original languageEnglish
Pages (from-to)149-156
Number of pages8
JournalThin Solid Films
Volume192
Issue number1
DOIs
StatePublished - 1 Nov 1990

Bibliographical note

Funding Information:
The authors wish to acknowledge the support of the Research Institute of King Fahd University of Petroleum and Minerals.

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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