Role of XRD for nanomaterial analysis

Awais Ahmad; Muhammad Pervaiz; Shamim Ramzan; Maryam Zaheer Kiyani; Anish Khan; Ikram Ahmad; Abdullah M. Asiri

doi:10.1016/B978-0-12-820773-4.00008-1

Role of XRD for nanomaterial analysis

Awais Ahmad
, Muhammad Pervaiz
, Shamim Ramzan
, Maryam Zaheer Kiyani
, Anish Khan
, Ikram Ahmad
, Abdullah M. Asiri

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

14 Scopus citations

Abstract

When X-rays strike atoms in a crystal, the phenomenon of scattering takes place. When the scattered X-rays from one atomic layer are in phase with scattered X-rays from another plane, then diffraction occurs, which enhances wavefronts. Atomic layer distances can be calculated from Bragg’s law of diffraction. Diffraction patterns act as fingerprints for a material. In this way, an unknown sample can be matched with a database to find a database that helps to describe the material. Nanomaterials exhibit diffraction patterns that are much broader compared to their bulk counterparts. This broadening helps to calculate the crystallite size.

Original language	English
Title of host publication	Nanomedicine Manufacturing and Applications
Publisher	Elsevier
Pages	149-161
Number of pages	13
ISBN (Electronic)	9780128207734
ISBN (Print)	9780128209424
DOIs	https://doi.org/10.1016/B978-0-12-820773-4.00008-1
State	Published - 1 Jan 2021
Externally published	Yes

Bibliographical note

Publisher Copyright:
© 2021 Elsevier Inc. All rights reserved.

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

Keywords

Application
Manufacturing
Protocol
XRD

ASJC Scopus subject areas

General Engineering
General Materials Science

Access to Document

10.1016/B978-0-12-820773-4.00008-1

Cite this

@inbook{b6341fb62ba34c1ea6a47b019f7ba454,

title = "Role of XRD for nanomaterial analysis",

abstract = "When X-rays strike atoms in a crystal, the phenomenon of scattering takes place. When the scattered X-rays from one atomic layer are in phase with scattered X-rays from another plane, then diffraction occurs, which enhances wavefronts. Atomic layer distances can be calculated from Bragg{\textquoteright}s law of diffraction. Diffraction patterns act as fingerprints for a material. In this way, an unknown sample can be matched with a database to find a database that helps to describe the material. Nanomaterials exhibit diffraction patterns that are much broader compared to their bulk counterparts. This broadening helps to calculate the crystallite size.",

keywords = "Application, Manufacturing, Protocol, XRD",

author = "Awais Ahmad and Muhammad Pervaiz and Shamim Ramzan and Kiyani, \{Maryam Zaheer\} and Anish Khan and Ikram Ahmad and Asiri, \{Abdullah M.\}",

year = "2021",

month = jan,

day = "1",

doi = "10.1016/B978-0-12-820773-4.00008-1",

language = "English",

isbn = "9780128209424",

pages = "149--161",

booktitle = "Nanomedicine Manufacturing and Applications",

publisher = "Elsevier",

address = "Netherlands",

}

TY - CHAP

T1 - Role of XRD for nanomaterial analysis

AU - Ahmad, Awais

AU - Pervaiz, Muhammad

AU - Ramzan, Shamim

AU - Kiyani, Maryam Zaheer

AU - Khan, Anish

AU - Ahmad, Ikram

AU - Asiri, Abdullah M.

PY - 2021/1/1

Y1 - 2021/1/1

N2 - When X-rays strike atoms in a crystal, the phenomenon of scattering takes place. When the scattered X-rays from one atomic layer are in phase with scattered X-rays from another plane, then diffraction occurs, which enhances wavefronts. Atomic layer distances can be calculated from Bragg’s law of diffraction. Diffraction patterns act as fingerprints for a material. In this way, an unknown sample can be matched with a database to find a database that helps to describe the material. Nanomaterials exhibit diffraction patterns that are much broader compared to their bulk counterparts. This broadening helps to calculate the crystallite size.

AB - When X-rays strike atoms in a crystal, the phenomenon of scattering takes place. When the scattered X-rays from one atomic layer are in phase with scattered X-rays from another plane, then diffraction occurs, which enhances wavefronts. Atomic layer distances can be calculated from Bragg’s law of diffraction. Diffraction patterns act as fingerprints for a material. In this way, an unknown sample can be matched with a database to find a database that helps to describe the material. Nanomaterials exhibit diffraction patterns that are much broader compared to their bulk counterparts. This broadening helps to calculate the crystallite size.

KW - Application

KW - Manufacturing

KW - Protocol

KW - XRD

UR - https://www.scopus.com/pages/publications/85115769790

U2 - 10.1016/B978-0-12-820773-4.00008-1

DO - 10.1016/B978-0-12-820773-4.00008-1

M3 - Chapter

AN - SCOPUS:85115769790

SN - 9780128209424

SP - 149

EP - 161

BT - Nanomedicine Manufacturing and Applications

PB - Elsevier

ER -

Role of XRD for nanomaterial analysis

Abstract

Bibliographical note

UN SDGs

Keywords

ASJC Scopus subject areas

Access to Document

Fingerprint

Cite this