Skip to main navigation Skip to search Skip to main content

Resistance to innovation: A dynamic capability model based enquiry into retailers’ resistance to blockchain adaptation

  • Yogesh K. Dwivedi*
  • , Janarthanan Balakrishnan
  • , Ronnie Das
  • , Vincent Dutot
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

92 Scopus citations

Abstract

Blockchain research is significantly growing, yet the practical implementation of blockchain among retailers is still in the novice stage. This research aims to study the underlying factors that build resistance toward blockchain among retailers. The study has used innovation resistance theory (IRT) and the dynamic capability model to build the conceptual model. The study used a single cross-sectional design to investigate the proposed model with data collected from 360 retailers. The data were analysed using structural equation modelling estimated with the maximum likelihood model. The study's results showed that the threat of data ownership is the most significant factor that builds resistance towards blockchain, followed by threat severity. The results also showed that managerial capability and innovation capability could indirectly influence the relationship of IRT variables to resistance towards blockchain. The research extends the knowledge in the blockchain and contributes to relevant literature and business practitioners concerned with the results.

Original languageEnglish
Article number113632
JournalJournal of Business Research
Volume157
DOIs
StatePublished - Mar 2023
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2022

Keywords

  • Blockchain resistance
  • Innovation capability
  • Managerial capability
  • The threat of data ownership

ASJC Scopus subject areas

  • Marketing

Fingerprint

Dive into the research topics of 'Resistance to innovation: A dynamic capability model based enquiry into retailers’ resistance to blockchain adaptation'. Together they form a unique fingerprint.

Cite this