Abstract
A generalized reliability model of a device subjected to several competing modes of failure is developed. The main emphasis is on describing the method for calculating the reliability and average life of a device subjected simultaneously to gradual (wear out) and sudden (chance) failures. A Weibull model is used corresponding to wear out failure and an exponential model corresponding to sudden failure. A numerical solution for calculating the average life of the device is presented.
| Original language | English |
|---|---|
| Pages (from-to) | 97-101 |
| Number of pages | 5 |
| Journal | High temperature science |
| State | Published - 1981 |
ASJC Scopus subject areas
- General Engineering
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