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Recent progress on irradiation-induced defect engineering of two-dimensional 2H-MoS 2 few layers

  • Guang Yi Zhao*
  • , Hua Deng
  • , Nathaniel Tyree
  • , Michael Guy
  • , Abdellah Lisfi
  • , Qing Peng
  • , Jia An Yan
  • , Chundong Wang
  • , Yucheng Lan
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

81 Scopus citations

Abstract

Atom-thick two-dimensional materials usually possess unique properties compared to their bulk counterparts. Their properties are significantly affected by defects, which could be uncontrollably introduced by irradiation. The effects of electromagnetic irradiation and particle irradiation on 2H MoS 2 two-dimensional nanolayers are reviewed in this paper, covering heavy ions, protons, electrons, gamma rays, X-rays, ultraviolet light, terahertz, and infrared irradiation. Various defects in MoS 2 layers were created by the defect engineering. Here we focus on their influence on the structural, electronic, catalytic, and magnetic performance of the 2D materials. Additionally, irradiation-induced doping is discussed and involved.

Original languageEnglish
Article number678
JournalApplied Sciences (Switzerland)
Volume9
Issue number4
DOIs
StatePublished - 16 Feb 2019
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2019 by the authors.

Keywords

  • 2D material
  • Irradiation
  • MoS
  • Review

ASJC Scopus subject areas

  • General Materials Science
  • Instrumentation
  • General Engineering
  • Process Chemistry and Technology
  • Computer Science Applications
  • Fluid Flow and Transfer Processes

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