Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy

Riya Bose; Jingya Sun; Jafar I. Khan; Basamat S. Shaheen; Aniruddha Adhikari; Tien Khee Ng; Victor M. Burlakov; Manas R. Parida; Davide Priante; Alain Goriely; Boon S. Ooi; Osman M. Bakr; Omar F. Mohammed

doi:10.1002/adma.201600202

Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy

Riya Bose
, Jingya Sun
, Jafar I. Khan
, Basamat S. Shaheen
, Aniruddha Adhikari
, Tien Khee Ng
, Victor M. Burlakov
, Manas R. Parida
, Davide Priante
, Alain Goriely
, Boon S. Ooi
, Osman M. Bakr
, Omar F. Mohammed^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

31 Scopus citations

Original language	English
Pages (from-to)	5106-5111
Number of pages	6
Journal	Advanced Materials
Volume	28
Issue number	25
DOIs	https://doi.org/10.1002/adma.201600202
State	Published - Jul 2016
Externally published	Yes

Keywords

carrier diffusion
carrier dynamics
InGaN
nanowires
real-space imaging
surface dynamics
ultrafast electron microscopy

ASJC Scopus subject areas

General Materials Science
Mechanics of Materials
Mechanical Engineering

Access to Document

10.1002/adma.201600202

Cite this

Bose, R., Sun, J., Khan, J. I., Shaheen, B. S., Adhikari, A., Ng, T. K., Burlakov, V. M., Parida, M. R., Priante, D., Goriely, A., Ooi, B. S., Bakr, O. M., & Mohammed, O. F. (2016). Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy. Advanced Materials, 28(25), 5106-5111. https://doi.org/10.1002/adma.201600202

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title = "Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy",

keywords = "carrier diffusion, carrier dynamics, InGaN, nanowires, real-space imaging, surface dynamics, ultrafast electron microscopy",

author = "Riya Bose and Jingya Sun and Khan, \{Jafar I.\} and Shaheen, \{Basamat S.\} and Aniruddha Adhikari and Ng, \{Tien Khee\} and Burlakov, \{Victor M.\} and Parida, \{Manas R.\} and Davide Priante and Alain Goriely and Ooi, \{Boon S.\} and Bakr, \{Osman M.\} and Mohammed, \{Omar F.\}",

year = "2016",

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language = "English",

volume = "28",

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AU - Bose, Riya

AU - Sun, Jingya

AU - Khan, Jafar I.

AU - Shaheen, Basamat S.

AU - Adhikari, Aniruddha

AU - Ng, Tien Khee

AU - Burlakov, Victor M.

AU - Parida, Manas R.

AU - Priante, Davide

AU - Goriely, Alain

AU - Ooi, Boon S.

AU - Bakr, Osman M.

AU - Mohammed, Omar F.

PY - 2016/7

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KW - carrier diffusion

KW - carrier dynamics

KW - InGaN

KW - nanowires

KW - real-space imaging

KW - surface dynamics

KW - ultrafast electron microscopy

UR - https://www.scopus.com/pages/publications/84977137958

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DO - 10.1002/adma.201600202

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EP - 5111

JO - Advanced Materials

JF - Advanced Materials

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