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Re-discovering adjoint sensitivities: Toward field-based analysis

  • Natalia K. Nikolova*
  • , M. Sadegh Dadash
  • , Mohamed H. Bakr
  • , Qi Jun Zhang
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Computing the derivatives of the scattering parameters of microwave devices with respect to shape and material parameters is a problem of significant interest in high-frequency computer-aided design. The pioneering work of Bandler, Monaco, Tiberio and others in the late 1960s and the early 1970s brought about the circuit-based sensitivity analysis of microwave networks. Here, we discuss some of the recent developments in adjoint sensitivities including field-based sensitivities, transient adjoint sensitivities, and adjoint-based neural networks. Two examples illustrate these approaches.

Original languageEnglish
Title of host publicationIMS 2012 - 2012 IEEE MTT-S International Microwave Symposium
DOIs
StatePublished - 2012
Externally publishedYes

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
ISSN (Print)0149-645X

Keywords

  • Computer-aided design
  • Modeling
  • Optimization
  • Sensitivity analysis

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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