Radiation tolerance tests on key components of the ePIC-dRICH readout card

S. Geminiani; B. R. Achari; N. Agrawal; M. Alexeev; C. Alice; R. Ammendola; P. Antonioli; C. Baldanza; L. Barion; A. Biagioni; A. Calivà; M. Capua; F. Capuani; A. Ciardiello; E. Cisbani; M. Chiosso; M. Contalbrigo; F. Cossio; M. Da Rocha Rolo; A. De Caro; D. De Gruttola; G. Dellacasa; D. Falchieri; S. Fazio; O. Frezza; N. Funicello; M. Garbini; N. Jacazio; F. Lo Cicero; A. Lonardo; R. Malaguti; F. Mammoliti; M. Martinelli; M. Mignone; C. Mingioni; M. Nenni; F. Noto; L. Occhiuto; A. Paladino; D. Panzieri; P. Perticaroli; S. Plavully; L. Polizzi; L. Pontisso; R. Preghenella; R. Ricci; L. Rignanese; C. Ripoli; C. Rossi; E. Rovati; N. Rubini; M. Ruspa; A. Saputi; F. Simula; F. Spizzo; U. Tamponi; E. Tassi; G. Torromeo; C. Tuvè; G. M. Urciuoli; S. Vallarino; P. Vicini; R. Wheadon

doi:10.1088/1748-0221/21/04/C04039

Radiation tolerance tests on key components of the ePIC-dRICH readout card

S. Geminiani^*
, B. R. Achari
, N. Agrawal
, M. Alexeev
, C. Alice
, R. Ammendola
, P. Antonioli
, C. Baldanza
, L. Barion
, A. Biagioni
, A. Calivà
, M. Capua
, F. Capuani
, A. Ciardiello
, E. Cisbani
, M. Chiosso
, M. Contalbrigo
, F. Cossio
, M. Da Rocha Rolo
, A. De Caro

D. De Gruttola, G. Dellacasa, D. Falchieri, S. Fazio, O. Frezza, N. Funicello, M. Garbini, N. Jacazio, F. Lo Cicero, A. Lonardo, R. Malaguti, F. Mammoliti, M. Martinelli, M. Mignone, C. Mingioni, M. Nenni, F. Noto, L. Occhiuto, A. Paladino, D. Panzieri, P. Perticaroli, S. Plavully, L. Polizzi, L. Pontisso, R. Preghenella, R. Ricci, L. Rignanese, C. Ripoli, C. Rossi, E. Rovati, N. Rubini, M. Ruspa, A. Saputi, F. Simula, F. Spizzo, U. Tamponi, E. Tassi, G. Torromeo, C. Tuvè, G. M. Urciuoli, S. Vallarino, P. Vicini, R. Wheadon

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

The dual-radiator RICH (dRICH) detector of the ePIC experiment will employ over 300000 SiPM pixels as photosensors, organized into more than 1000 Photon Detection Units. Each PDU is a compact module, approximately 5 × 5 × 12 cm³in size, including four custom ASICs connected to 256 SiPMs and an FPGA-based readout card (RDO) responsible for data acquisition and control. Considering the moderately harsh radiation environment expected in the dRICH detector, this study reports on proton irradiation tests performed on key components of the RDO card to assess their tolerance to cumulative Total Ionizing Dose (TID) and Single Event Effects (SEE). All tested components demonstrated radiation tolerance beyond the TID levels expected for the dRICH environment, with the exception of the ATtiny817 microcontroller, which showed destructive failure. Furthermore, as expected, the observed Single Event Upset (SEU) rates call for appropriate mitigation strategies in the final system design.

Original language	English
Article number	C04039
Journal	Journal of Instrumentation
Volume	21
Issue number	4
DOIs	https://doi.org/10.1088/1748-0221/21/04/C04039
State	Published - 1 Apr 2026
Externally published	Yes

Bibliographical note

Publisher Copyright:
© 2026 The Author(s)

Keywords

Cherenkov detectors
Front-end electronics for detector readout
Radiation damage to electronic components
Radiation-hard electronics

ASJC Scopus subject areas

Mathematical Physics
Instrumentation

Access to Document

10.1088/1748-0221/21/04/C04039

Cite this

Geminiani, S., Achari, B. R., Agrawal, N., Alexeev, M., Alice, C., Ammendola, R., Antonioli, P., Baldanza, C., Barion, L., Biagioni, A., Calivà, A., Capua, M., Capuani, F., Ciardiello, A., Cisbani, E., Chiosso, M., Contalbrigo, M., Cossio, F., Da Rocha Rolo, M., ... Wheadon, R. (2026). Radiation tolerance tests on key components of the ePIC-dRICH readout card. Journal of Instrumentation, 21(4), Article C04039. https://doi.org/10.1088/1748-0221/21/04/C04039

@article{2ccdda0d84294b61af55fb5a88b21ca5,

title = "Radiation tolerance tests on key components of the ePIC-dRICH readout card",

abstract = "The dual-radiator RICH (dRICH) detector of the ePIC experiment will employ over 300000 SiPM pixels as photosensors, organized into more than 1000 Photon Detection Units. Each PDU is a compact module, approximately 5 × 5 × 12 cm3in size, including four custom ASICs connected to 256 SiPMs and an FPGA-based readout card (RDO) responsible for data acquisition and control. Considering the moderately harsh radiation environment expected in the dRICH detector, this study reports on proton irradiation tests performed on key components of the RDO card to assess their tolerance to cumulative Total Ionizing Dose (TID) and Single Event Effects (SEE). All tested components demonstrated radiation tolerance beyond the TID levels expected for the dRICH environment, with the exception of the ATtiny817 microcontroller, which showed destructive failure. Furthermore, as expected, the observed Single Event Upset (SEU) rates call for appropriate mitigation strategies in the final system design.",

keywords = "Cherenkov detectors, Front-end electronics for detector readout, Radiation damage to electronic components, Radiation-hard electronics",

author = "S. Geminiani and Achari, \{B. R.\} and N. Agrawal and M. Alexeev and C. Alice and R. Ammendola and P. Antonioli and C. Baldanza and L. Barion and A. Biagioni and A. Caliv{\`a} and M. Capua and F. Capuani and A. Ciardiello and E. Cisbani and M. Chiosso and M. Contalbrigo and F. Cossio and \{Da Rocha Rolo\}, M. and \{De Caro\}, A. and \{De Gruttola\}, D. and G. Dellacasa and D. Falchieri and S. Fazio and O. Frezza and N. Funicello and M. Garbini and N. Jacazio and \{Lo Cicero\}, F. and A. Lonardo and R. Malaguti and F. Mammoliti and M. Martinelli and M. Mignone and C. Mingioni and M. Nenni and F. Noto and L. Occhiuto and A. Paladino and D. Panzieri and P. Perticaroli and S. Plavully and L. Polizzi and L. Pontisso and R. Preghenella and R. Ricci and L. Rignanese and C. Ripoli and C. Rossi and E. Rovati and N. Rubini and M. Ruspa and A. Saputi and F. Simula and F. Spizzo and U. Tamponi and E. Tassi and G. Torromeo and C. Tuv{\`e} and Urciuoli, \{G. M.\} and S. Vallarino and P. Vicini and R. Wheadon",

note = "Publisher Copyright: {\textcopyright} 2026 The Author(s)",

year = "2026",

month = apr,

day = "1",

doi = "10.1088/1748-0221/21/04/C04039",

language = "English",

volume = "21",

journal = "Journal of Instrumentation",

issn = "1748-0221",

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Geminiani, S, Achari, BR, Agrawal, N, Alexeev, M, Alice, C, Ammendola, R, Antonioli, P, Baldanza, C, Barion, L, Biagioni, A, Calivà, A, Capua, M, Capuani, F, Ciardiello, A, Cisbani, E, Chiosso, M, Contalbrigo, M, Cossio, F, Da Rocha Rolo, M, De Caro, A, De Gruttola, D, Dellacasa, G, Falchieri, D, Fazio, S, Frezza, O, Funicello, N, Garbini, M, Jacazio, N, Lo Cicero, F, Lonardo, A, Malaguti, R, Mammoliti, F, Martinelli, M, Mignone, M, Mingioni, C, Nenni, M, Noto, F, Occhiuto, L, Paladino, A, Panzieri, D, Perticaroli, P, Plavully, S, Polizzi, L, Pontisso, L, Preghenella, R, Ricci, R, Rignanese, L, Ripoli, C, Rossi, C, Rovati, E, Rubini, N, Ruspa, M, Saputi, A, Simula, F, Spizzo, F, Tamponi, U, Tassi, E, Torromeo, G, Tuvè, C, Urciuoli, GM, Vallarino, S, Vicini, P & Wheadon, R 2026, 'Radiation tolerance tests on key components of the ePIC-dRICH readout card', Journal of Instrumentation, vol. 21, no. 4, C04039. https://doi.org/10.1088/1748-0221/21/04/C04039

TY - JOUR

T1 - Radiation tolerance tests on key components of the ePIC-dRICH readout card

AU - Geminiani, S.

AU - Achari, B. R.

AU - Agrawal, N.

AU - Alexeev, M.

AU - Alice, C.

AU - Ammendola, R.

AU - Antonioli, P.

AU - Baldanza, C.

AU - Barion, L.

AU - Biagioni, A.

AU - Calivà, A.

AU - Capua, M.

AU - Capuani, F.

AU - Ciardiello, A.

AU - Cisbani, E.

AU - Chiosso, M.

AU - Contalbrigo, M.

AU - Cossio, F.

AU - Da Rocha Rolo, M.

AU - De Caro, A.

AU - De Gruttola, D.

AU - Dellacasa, G.

AU - Falchieri, D.

AU - Fazio, S.

AU - Frezza, O.

AU - Funicello, N.

AU - Garbini, M.

AU - Jacazio, N.

AU - Lo Cicero, F.

AU - Lonardo, A.

AU - Malaguti, R.

AU - Mammoliti, F.

AU - Martinelli, M.

AU - Mignone, M.

AU - Mingioni, C.

AU - Nenni, M.

AU - Noto, F.

AU - Occhiuto, L.

AU - Paladino, A.

AU - Panzieri, D.

AU - Perticaroli, P.

AU - Plavully, S.

AU - Polizzi, L.

AU - Pontisso, L.

AU - Preghenella, R.

AU - Ricci, R.

AU - Rignanese, L.

AU - Ripoli, C.

AU - Rossi, C.

AU - Rovati, E.

AU - Rubini, N.

AU - Ruspa, M.

AU - Saputi, A.

AU - Simula, F.

AU - Spizzo, F.

AU - Tamponi, U.

AU - Tassi, E.

AU - Torromeo, G.

AU - Tuvè, C.

AU - Urciuoli, G. M.

AU - Vallarino, S.

AU - Vicini, P.

AU - Wheadon, R.

PY - 2026/4/1

Y1 - 2026/4/1

N2 - The dual-radiator RICH (dRICH) detector of the ePIC experiment will employ over 300000 SiPM pixels as photosensors, organized into more than 1000 Photon Detection Units. Each PDU is a compact module, approximately 5 × 5 × 12 cm3in size, including four custom ASICs connected to 256 SiPMs and an FPGA-based readout card (RDO) responsible for data acquisition and control. Considering the moderately harsh radiation environment expected in the dRICH detector, this study reports on proton irradiation tests performed on key components of the RDO card to assess their tolerance to cumulative Total Ionizing Dose (TID) and Single Event Effects (SEE). All tested components demonstrated radiation tolerance beyond the TID levels expected for the dRICH environment, with the exception of the ATtiny817 microcontroller, which showed destructive failure. Furthermore, as expected, the observed Single Event Upset (SEU) rates call for appropriate mitigation strategies in the final system design.

AB - The dual-radiator RICH (dRICH) detector of the ePIC experiment will employ over 300000 SiPM pixels as photosensors, organized into more than 1000 Photon Detection Units. Each PDU is a compact module, approximately 5 × 5 × 12 cm3in size, including four custom ASICs connected to 256 SiPMs and an FPGA-based readout card (RDO) responsible for data acquisition and control. Considering the moderately harsh radiation environment expected in the dRICH detector, this study reports on proton irradiation tests performed on key components of the RDO card to assess their tolerance to cumulative Total Ionizing Dose (TID) and Single Event Effects (SEE). All tested components demonstrated radiation tolerance beyond the TID levels expected for the dRICH environment, with the exception of the ATtiny817 microcontroller, which showed destructive failure. Furthermore, as expected, the observed Single Event Upset (SEU) rates call for appropriate mitigation strategies in the final system design.

KW - Cherenkov detectors

KW - Front-end electronics for detector readout

KW - Radiation damage to electronic components

KW - Radiation-hard electronics

UR - https://www.scopus.com/pages/publications/105036165854

U2 - 10.1088/1748-0221/21/04/C04039

DO - 10.1088/1748-0221/21/04/C04039

M3 - Article

AN - SCOPUS:105036165854

SN - 1748-0221

VL - 21

JO - Journal of Instrumentation

JF - Journal of Instrumentation

IS - 4

M1 - C04039

ER -

Radiation tolerance tests on key components of the ePIC-dRICH readout card

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

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