Abstract
In this paper, the procedure for conducting quantitative elemental analysis by ZAF correction method using wavelength dispersive X-ray spectroscopy (WDS) in an electron probe microanalyzer (EPMA) is elaborated. Analysis of a thermal barrier coating (TBC) system formed on a Ni-based single crystal superalloy is presented as an example to illustrate the analysis of samples consisting of a large number of major and minor elements. The analysis was performed by known standards and measured peak-to-background intensity ratios. The procedure for using separate set of acquisition conditions for major and minor element analysis is explained and its importance is stressed.
| Original language | English |
|---|---|
| Pages (from-to) | 192-199 |
| Number of pages | 8 |
| Journal | Materials Characterization |
| Volume | 56 |
| Issue number | 3 |
| DOIs | |
| State | Published - Apr 2006 |
Bibliographical note
Funding Information:The authors wish to acknowledge the support of the Research Institute of King Fahd University of Petroleum & Minerals.
Keywords
- EPMA
- Quantitative analysis
- Thermal barrier coating
- Wavelength dispersive X-ray spectroscopy
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
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