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Proper choice of location cumulative sum control charts for different environments

  • Hafiz Zafar Nazir*
  • , Muhammad Ikram
  • , Muhammad Wasim Amir
  • , Noureen Akhtar
  • , Zameer Abbas
  • , Muhammad Riaz
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

In the field of quality control, statistical process control (SPC) has its significance. The control charts are important tools of the SPC to observe the outputs of the production process. The cumulative sum (CUSUM) charting structure is one such technique that is designed to identify the medium and slight changes in the process parameters. In the literature, the assumption of normality is considered ideal for the control chart but in practice, many quality characteristics do not follow the assumption of normality. The current study proposes a class of CUSUM control charts for the location parameter of the process and investigates the performance of said location charts based on ranked set sampling (RSS) for quality characteristics having different environments. Different point estimators of location are considered in this study to develop the location control charts under normal, and a variety of non-normal environments. The numerical results show that the newly designed schemes perform uniformly well than their competitors. A real-life example linked with the manufacturing process is also provided for the practical implementation of the proposed scheme.

Original languageEnglish
Pages (from-to)3537-3554
Number of pages18
JournalQuality and Reliability Engineering International
Volume40
Issue number6
DOIs
StateAccepted/In press - 2024

Bibliographical note

Publisher Copyright:
© 2024 John Wiley & Sons Ltd.

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 9 - Industry, Innovation, and Infrastructure
    SDG 9 Industry, Innovation, and Infrastructure

Keywords

  • average run length
  • CUSUM
  • location parameter
  • normal
  • performance measures
  • semiconductor

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Management Science and Operations Research

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