Probing the magnetic profile of diluted magnetic semiconductors using polarized neutron reflectivity

X. Luo; L. T. Tseng; W. T. Lee; T. T. Tan; N. N. Bao; R. Liu; J. Ding; S. Li; V. Lauter; J. B. Yi

doi:10.1038/s41598-017-06793-w

Probing the magnetic profile of diluted magnetic semiconductors using polarized neutron reflectivity

X. Luo
, L. T. Tseng
, W. T. Lee
, T. T. Tan
, N. N. Bao
, R. Liu
, J. Ding
, S. Li
, V. Lauter
, J. B. Yi^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Abstract

Room temperature ferromagnetism has been observed in the Cu doped ZnO films deposited under an oxygen partial pressure of 10^-3 and 10^-5 torr on Pt (200 nm)/Ti (45 nm)/Si (001) substrates using pulsed laser deposition. Due to the deposition at relatively high temperature (873 K), Cu and Ti atoms diffuse to the surface and interface, which significantly affects the magnetic properties. Depth sensitive polarized neutron reflectometry method provides the details of the composition and magnetization profiles and shows that an accumulation of Cu on the surface leads to an increase in the magnetization near the surface. Our results reveal that the presence of the copper at Zn sites induces ferromagnetism at room temperature, confirming intrinsic ferromagnetism.

Original language	English
Article number	6341
Journal	Scientific Reports
Volume	7
Issue number	1
DOIs	https://doi.org/10.1038/s41598-017-06793-w
State	Published - 1 Dec 2017
Externally published	Yes

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Publisher Copyright:
© 2017 The Author(s).

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title = "Probing the magnetic profile of diluted magnetic semiconductors using polarized neutron reflectivity",

abstract = "Room temperature ferromagnetism has been observed in the Cu doped ZnO films deposited under an oxygen partial pressure of 10-3 and 10-5 torr on Pt (200 nm)/Ti (45 nm)/Si (001) substrates using pulsed laser deposition. Due to the deposition at relatively high temperature (873 K), Cu and Ti atoms diffuse to the surface and interface, which significantly affects the magnetic properties. Depth sensitive polarized neutron reflectometry method provides the details of the composition and magnetization profiles and shows that an accumulation of Cu on the surface leads to an increase in the magnetization near the surface. Our results reveal that the presence of the copper at Zn sites induces ferromagnetism at room temperature, confirming intrinsic ferromagnetism.",

author = "X. Luo and Tseng, \{L. T.\} and Lee, \{W. T.\} and Tan, \{T. T.\} and Bao, \{N. N.\} and R. Liu and J. Ding and S. Li and V. Lauter and Yi, \{J. B.\}",

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doi = "10.1038/s41598-017-06793-w",

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T1 - Probing the magnetic profile of diluted magnetic semiconductors using polarized neutron reflectivity

AU - Luo, X.

AU - Tseng, L. T.

AU - Lee, W. T.

AU - Tan, T. T.

AU - Bao, N. N.

AU - Liu, R.

AU - Ding, J.

AU - Li, S.

AU - Lauter, V.

AU - Yi, J. B.

PY - 2017/12/1

Y1 - 2017/12/1

N2 - Room temperature ferromagnetism has been observed in the Cu doped ZnO films deposited under an oxygen partial pressure of 10-3 and 10-5 torr on Pt (200 nm)/Ti (45 nm)/Si (001) substrates using pulsed laser deposition. Due to the deposition at relatively high temperature (873 K), Cu and Ti atoms diffuse to the surface and interface, which significantly affects the magnetic properties. Depth sensitive polarized neutron reflectometry method provides the details of the composition and magnetization profiles and shows that an accumulation of Cu on the surface leads to an increase in the magnetization near the surface. Our results reveal that the presence of the copper at Zn sites induces ferromagnetism at room temperature, confirming intrinsic ferromagnetism.

AB - Room temperature ferromagnetism has been observed in the Cu doped ZnO films deposited under an oxygen partial pressure of 10-3 and 10-5 torr on Pt (200 nm)/Ti (45 nm)/Si (001) substrates using pulsed laser deposition. Due to the deposition at relatively high temperature (873 K), Cu and Ti atoms diffuse to the surface and interface, which significantly affects the magnetic properties. Depth sensitive polarized neutron reflectometry method provides the details of the composition and magnetization profiles and shows that an accumulation of Cu on the surface leads to an increase in the magnetization near the surface. Our results reveal that the presence of the copper at Zn sites induces ferromagnetism at room temperature, confirming intrinsic ferromagnetism.

UR - https://www.scopus.com/pages/publications/85025807936

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DO - 10.1038/s41598-017-06793-w

M3 - Article

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AN - SCOPUS:85025807936

SN - 2045-2322

VL - 7

JO - Scientific Reports

JF - Scientific Reports

IS - 1

M1 - 6341

ER -

Probing the magnetic profile of diluted magnetic semiconductors using polarized neutron reflectivity

Abstract

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