Abstract
Spintronic devices that utilize thermal noise for producing a natural stochastic response have enabled the concept of probabilistic-bits (p-bits), opening the door for a spectrum of untapped opportunities and new applications. Here we propose a probabilistic autonomous data acquisition approach that translates the stochastic response of a p-bit into a cognitive response of deciding whether to sample data or not. In the proposed approach, a modified p-bit design with enhanced tunability is used and is driven by an analog feature extraction circuit. Simulation results on data from an active seismic survey demonstrate the feasibility of lossless probabilistic data acquisition, with close to 50 % saving in the active operation time of the system and in the number of generated samples.
| Original language | English |
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| Title of host publication | IEEE Electron Devices Technology and Manufacturing Conference |
| Subtitle of host publication | Strengthening the Globalization in Semiconductors, EDTM 2024 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9798350371529 |
| DOIs | |
| State | Published - 2024 |
| Event | 8th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2024 - Bangalore, India Duration: 3 Mar 2024 → 6 Mar 2024 |
Publication series
| Name | IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024 |
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Conference
| Conference | 8th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2024 |
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| Country/Territory | India |
| City | Bangalore |
| Period | 3/03/24 → 6/03/24 |
Bibliographical note
Publisher Copyright:© 2024 IEEE.
Keywords
- autonomous
- data-acquisition
- MTJ
- p-bit
- sensing
- stochastic
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering
- Instrumentation