Abstract
A Fourier-series model is presented for the capacitance-voltage characteristic of a MOS gate capacitor using transistors biased in the strong inversion or the accumulation region. Using this model closed-form expressions are obtained for predicting the harmonic distortion of the MOS gate capacitor driven by a large-amplitude sinusoidal current. Results are compared with reported experimental observations.
Original language | English |
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Pages (from-to) | 299-304 |
Number of pages | 6 |
Journal | Analog Integrated Circuits and Signal Processing |
Volume | 16 |
Issue number | 3 |
DOIs | |
State | Published - 1998 |
Keywords
- Harmonic distortion
- MOS capacitors
ASJC Scopus subject areas
- Signal Processing
- Hardware and Architecture
- Surfaces, Coatings and Films