Prediction of the Harmonic Distortion in Mosfet Gate Capacitors

Muhammad Taher Abuelma'atti*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

A Fourier-series model is presented for the capacitance-voltage characteristic of a MOS gate capacitor using transistors biased in the strong inversion or the accumulation region. Using this model closed-form expressions are obtained for predicting the harmonic distortion of the MOS gate capacitor driven by a large-amplitude sinusoidal current. Results are compared with reported experimental observations.

Original languageEnglish
Pages (from-to)299-304
Number of pages6
JournalAnalog Integrated Circuits and Signal Processing
Volume16
Issue number3
DOIs
StatePublished - 1998

Keywords

  • Harmonic distortion
  • MOS capacitors

ASJC Scopus subject areas

  • Signal Processing
  • Hardware and Architecture
  • Surfaces, Coatings and Films

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