Prediction of microbial spoilage and shelf-life of bakery products through hyperspectral imaging

Zainab Saleem, Muhammad Hussain Khan, Muhammad Ahmad*, Ahmed Sohaib, Hamail Ayaz, Manuel Mazzara

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

38 Scopus citations

Abstract

The shelf life of bakery products highly depends on the environment and it may get spoiled earlier than its expiry which results in food-borne diseases and may affect human health or may get wasted beforehand. The traditional spoilage detection methods are time-consuming and destructive in nature due to the time taken to get microbiological results. To the best of the author’s knowledge, this work presents a novel method to automatically predict the microbial spoilage and detect its spatial location in baked items using Hyperspectral Imaging (HSI) range from 395 − 1000 nm. A spectral preserve fusion technique has been proposed to spatially enhance the HSI images while preserving the spectral information. Furthermore, to automatically detect the spoilage, Principal Component Analysis (PCA) followed by K-means and SVM has been used. The proposed approach can detect the spoilage almost 24 hours before it started appearing or visible to a naked eye with 98.13% accuracy on test data. Furthermore, the trained model has been validated through external dataset and detected the spoilage almost a day before it started appearing visually.

Original languageEnglish
Pages (from-to)176986-176996
Number of pages11
JournalIEEE Access
Volume8
DOIs
StatePublished - 2020
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2020 Institute of Electrical and Electronics Engineers Inc.. All rights reserved.

Keywords

  • Fungus detection and prediction
  • Hyper sharpening
  • K-means
  • PCA
  • SVM
  • Shelf life of bakery products

ASJC Scopus subject areas

  • General Computer Science
  • General Materials Science
  • General Engineering

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