Polymorphism of low-dimensional material with ternary composition chalcogenide Ta2Ni3Se8

Jiho Jeon, Chaeheon Woo, Kyung Hwan Choi, Byung Joo Jeong, Sudong Chae, Seoungbae Oh, Sang Ok Yoon, Jungyoon Ahn, Tae Yeong Kim, Sang Hoon Lee, Xue Dong, Junaid Ali, Ghulam Asghar, Xiaojie Zhang, Jinsu Kang, Jae Hyuk Park, Hak Ki Yu*, Jae Young Choi*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

In this study, the polymorphism of Ta2Ni3Se8, a three-component one-dimensional chalcogenide material, was discovered. It was confirmed through X-ray diffraction and transmission electron microscopy analyses that the newly identified tetragonal phase of the compound (T-Ta2Ni3Se8) had a different crystal structure from the previously reported orthorhombic phase (O-Ta2Ni3Se8). Conventional O-Ta2Ni3Se8 is a semiconductor material with ambipolar characteristics, whereas T-Ta2Ni3Se8 showed a metallic characteristic in which the electrical resistance slightly increased as the temperature increased. The change in electrical properties due to the variation in lattice isotropy according to the transformation of the crystal system (orthorhombic to tetragonal) is expected to be an important starting point for polymorphism studies of multi-component low-dimensional materials in the future.

Original languageEnglish
Article number164463
JournalJournal of Alloys and Compounds
Volume907
DOIs
StatePublished - 25 Jun 2022
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2022 Elsevier B.V.

Keywords

  • 1D materials
  • Low-dimensional materials
  • Polymorphism
  • TaNiSe

ASJC Scopus subject areas

  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

Fingerprint

Dive into the research topics of 'Polymorphism of low-dimensional material with ternary composition chalcogenide Ta2Ni3Se8'. Together they form a unique fingerprint.

Cite this