Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies

J. D. Budai; W. Liu; J. Z. Tischler; Z. W. Pan; D. P. Norton; B. C. Larson; W. Yang; G. E. Ice

doi:10.1016/j.tsf.2008.04.045

Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies

J. D. Budai^*
, W. Liu
, J. Z. Tischler
, Z. W. Pan
, D. P. Norton
, B. C. Larson
, W. Yang
, G. E. Ice

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

26 Scopus citations

Abstract

The availability of intense, focused synchrotron X-ray microbeams has enabled new techniques for materials investigations with sub-micron spatial resolution. The scanning microbeam setup we have developed at the XOR-UNI beamline at the Advanced Photon Source (APS) is versatile in that it provides 1D, 2D or 3D scans (including depth resolution), and can alternate between polychromatic- and monochromatic-beam modes. Focusing in both modes uses elliptical Kirkpatrick-Baez (K-B) reflecting mirrors. Beam diameters of ~ 500 nm FWHM are now routine, and 90 nm focus has been demonstrated. In white-beam mode, a CCD detector records a complete Laue diffraction pattern, which is analyzed with an automated indexing program. These X-ray diffraction patterns provide real-space maps of the local lattice structure, crystal orientation, grain morphology, and strain tensor. Spatially-resolved X-ray microdiffraction studies are now providing previously unavailable measurements of local microstructures. These measurements, in turn, yield new insights in several classic fields of materials science. This paper will illustrate the application of polychromatic scanning X-ray microscopy with examples from 1D, 2D and 3D materials systems. In 1D systems, we have mapped the structure and orientation of an individual ZnO nanorod along with the associated Ge catalyst particle used to control the nanocrystal growth. In 2D systems, X-ray microdiffraction studies have revealed the mechanisms for local crystallographic tilting in epitaxial oxide films grown on textured Ni substrates for superconducting applications. In 3D systems, X-ray microscopy investigations have included in-situ studies of microstructural evolution during thermal grain growth in polycrystalline aluminum. In general, these spatially-resolved measurements provide important new insights and are valuable as input for theoretical and computer modeling studies of a wide range of material processes.

Original language	English
Pages (from-to)	8013-8021
Number of pages	9
Journal	Thin Solid Films
Volume	516
Issue number	22
DOIs	https://doi.org/10.1016/j.tsf.2008.04.045
State	Published - 30 Sep 2008
Externally published	Yes

Bibliographical note

Funding Information:
Research sponsored by the Division of Materials Sciences and Engineering, U.S. Department of Energy, Office of Science under contract with UT-Battelle, LLC. UNI-CAT/XOR supported by ORNL, UIUC-MRL, NIST, UOP and DOE-BES Office of Science. Use of the APS was supported by the U.S. Department of Energy, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.

Keywords

3D X-ray microscopy
Microbeams
Nanodiffraction
Nanostructures
Polychromatic microdiffraction

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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10.1016/j.tsf.2008.04.045

Cite this

@article{d2f1152cd7db4cdc87568be472d652fb,

title = "Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies",

abstract = "The availability of intense, focused synchrotron X-ray microbeams has enabled new techniques for materials investigations with sub-micron spatial resolution. The scanning microbeam setup we have developed at the XOR-UNI beamline at the Advanced Photon Source (APS) is versatile in that it provides 1D, 2D or 3D scans (including depth resolution), and can alternate between polychromatic- and monochromatic-beam modes. Focusing in both modes uses elliptical Kirkpatrick-Baez (K-B) reflecting mirrors. Beam diameters of \textasciitilde{} 500 nm FWHM are now routine, and 90 nm focus has been demonstrated. In white-beam mode, a CCD detector records a complete Laue diffraction pattern, which is analyzed with an automated indexing program. These X-ray diffraction patterns provide real-space maps of the local lattice structure, crystal orientation, grain morphology, and strain tensor. Spatially-resolved X-ray microdiffraction studies are now providing previously unavailable measurements of local microstructures. These measurements, in turn, yield new insights in several classic fields of materials science. This paper will illustrate the application of polychromatic scanning X-ray microscopy with examples from 1D, 2D and 3D materials systems. In 1D systems, we have mapped the structure and orientation of an individual ZnO nanorod along with the associated Ge catalyst particle used to control the nanocrystal growth. In 2D systems, X-ray microdiffraction studies have revealed the mechanisms for local crystallographic tilting in epitaxial oxide films grown on textured Ni substrates for superconducting applications. In 3D systems, X-ray microscopy investigations have included in-situ studies of microstructural evolution during thermal grain growth in polycrystalline aluminum. In general, these spatially-resolved measurements provide important new insights and are valuable as input for theoretical and computer modeling studies of a wide range of material processes.",

keywords = "3D X-ray microscopy, Microbeams, Nanodiffraction, Nanostructures, Polychromatic microdiffraction",

author = "Budai, \{J. D.\} and W. Liu and Tischler, \{J. Z.\} and Pan, \{Z. W.\} and Norton, \{D. P.\} and Larson, \{B. C.\} and W. Yang and Ice, \{G. E.\}",

note = "Funding Information: Research sponsored by the Division of Materials Sciences and Engineering, U.S. Department of Energy, Office of Science under contract with UT-Battelle, LLC. UNI-CAT/XOR supported by ORNL, UIUC-MRL, NIST, UOP and DOE-BES Office of Science. Use of the APS was supported by the U.S. Department of Energy, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.",

year = "2008",

month = sep,

day = "30",

doi = "10.1016/j.tsf.2008.04.045",

language = "English",

volume = "516",

pages = "8013--8021",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier B.V.",

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AU - Budai, J. D.

AU - Liu, W.

AU - Tischler, J. Z.

AU - Pan, Z. W.

AU - Norton, D. P.

AU - Larson, B. C.

AU - Yang, W.

AU - Ice, G. E.

N1 - Funding Information: Research sponsored by the Division of Materials Sciences and Engineering, U.S. Department of Energy, Office of Science under contract with UT-Battelle, LLC. UNI-CAT/XOR supported by ORNL, UIUC-MRL, NIST, UOP and DOE-BES Office of Science. Use of the APS was supported by the U.S. Department of Energy, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.

PY - 2008/9/30

Y1 - 2008/9/30

N2 - The availability of intense, focused synchrotron X-ray microbeams has enabled new techniques for materials investigations with sub-micron spatial resolution. The scanning microbeam setup we have developed at the XOR-UNI beamline at the Advanced Photon Source (APS) is versatile in that it provides 1D, 2D or 3D scans (including depth resolution), and can alternate between polychromatic- and monochromatic-beam modes. Focusing in both modes uses elliptical Kirkpatrick-Baez (K-B) reflecting mirrors. Beam diameters of ~ 500 nm FWHM are now routine, and 90 nm focus has been demonstrated. In white-beam mode, a CCD detector records a complete Laue diffraction pattern, which is analyzed with an automated indexing program. These X-ray diffraction patterns provide real-space maps of the local lattice structure, crystal orientation, grain morphology, and strain tensor. Spatially-resolved X-ray microdiffraction studies are now providing previously unavailable measurements of local microstructures. These measurements, in turn, yield new insights in several classic fields of materials science. This paper will illustrate the application of polychromatic scanning X-ray microscopy with examples from 1D, 2D and 3D materials systems. In 1D systems, we have mapped the structure and orientation of an individual ZnO nanorod along with the associated Ge catalyst particle used to control the nanocrystal growth. In 2D systems, X-ray microdiffraction studies have revealed the mechanisms for local crystallographic tilting in epitaxial oxide films grown on textured Ni substrates for superconducting applications. In 3D systems, X-ray microscopy investigations have included in-situ studies of microstructural evolution during thermal grain growth in polycrystalline aluminum. In general, these spatially-resolved measurements provide important new insights and are valuable as input for theoretical and computer modeling studies of a wide range of material processes.

AB - The availability of intense, focused synchrotron X-ray microbeams has enabled new techniques for materials investigations with sub-micron spatial resolution. The scanning microbeam setup we have developed at the XOR-UNI beamline at the Advanced Photon Source (APS) is versatile in that it provides 1D, 2D or 3D scans (including depth resolution), and can alternate between polychromatic- and monochromatic-beam modes. Focusing in both modes uses elliptical Kirkpatrick-Baez (K-B) reflecting mirrors. Beam diameters of ~ 500 nm FWHM are now routine, and 90 nm focus has been demonstrated. In white-beam mode, a CCD detector records a complete Laue diffraction pattern, which is analyzed with an automated indexing program. These X-ray diffraction patterns provide real-space maps of the local lattice structure, crystal orientation, grain morphology, and strain tensor. Spatially-resolved X-ray microdiffraction studies are now providing previously unavailable measurements of local microstructures. These measurements, in turn, yield new insights in several classic fields of materials science. This paper will illustrate the application of polychromatic scanning X-ray microscopy with examples from 1D, 2D and 3D materials systems. In 1D systems, we have mapped the structure and orientation of an individual ZnO nanorod along with the associated Ge catalyst particle used to control the nanocrystal growth. In 2D systems, X-ray microdiffraction studies have revealed the mechanisms for local crystallographic tilting in epitaxial oxide films grown on textured Ni substrates for superconducting applications. In 3D systems, X-ray microscopy investigations have included in-situ studies of microstructural evolution during thermal grain growth in polycrystalline aluminum. In general, these spatially-resolved measurements provide important new insights and are valuable as input for theoretical and computer modeling studies of a wide range of material processes.

KW - 3D X-ray microscopy

KW - Microbeams

KW - Nanodiffraction

KW - Nanostructures

KW - Polychromatic microdiffraction

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DO - 10.1016/j.tsf.2008.04.045

M3 - Article

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JF - Thin Solid Films

IS - 22

ER -

Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

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