Outliers detection models in shewhart control charts; An application in photolithography: A semiconductor manufacturing industry
- Ishaq Adeyanju Raji
- , Muhammad Hisyam Lee*
- , Muhammad Riaz
- , Mu'azu Ramat Abujiya
- , Nasir Abbas
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
18
Scopus
citations