Abstract
Thin films of hafnium oxide were deposited by electron beam evaporation. The films were characterized using X-ray diffraction, X-ray photoelectron spectroscopy and normal incidence transmittance. The films were amorphous, stoichiometric, and transparent down to a wavelength of 300 nm. The optical properties of the films, including the refractive index, the absorption index and the bandgap, were determined. The refractive index, in the visible, was relatively high (1.89). The direct bandgap was found to be 5.41 eV. Absorption was insignificant for wavelengths above 250 nm. A heat mirror was built based on the hafnium oxide/silver/hafnium oxide/glass system. This heat mirror was found to be transparent in the visible with an average transmittance of 72.4%, and reflective in the near infrared (wavelength = 700-2000nm) with an average reflectance of 67.0%. Such a heat mirror can be used in applications involving energy-efficient windows.
| Original language | English |
|---|---|
| Pages (from-to) | 383-387 |
| Number of pages | 5 |
| Journal | Optical Materials |
| Volume | 27 |
| Issue number | 3 |
| DOIs | |
| State | Published - Dec 2004 |
Bibliographical note
Funding Information:The support provided by the Research Institute and the Physics Department of King Fahd University of Petroleum and Minerals is acknowledged. Several useful discussions with Dr. E.E. Khawaja and Dr. S.M.A. Durrani and their help at various stages of this work are acknowledged. The assistance of Mr. S. Jaroudi with the XRD measurements is also acknowledged.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- General Computer Science
- Atomic and Molecular Physics, and Optics
- Spectroscopy
- Physical and Theoretical Chemistry
- Organic Chemistry
- Inorganic Chemistry
- Electrical and Electronic Engineering
