Abstract
The optical constants of thermally evaporated thin films of ZnS have been determined by measurements of transmittance at normal incidence from two films of different thickness. A single-layer model has been successfully used for the films. The results are compared with those obtained earlier for thermally evaporated ZnS films using reflectance and transmittance measurements (where a two-layer model for a ZnS film was used). The advantage of the present method over the earlier one is the readily available measurement facilities.
| Original language | English |
|---|---|
| Pages (from-to) | 199-202 |
| Number of pages | 4 |
| Journal | Thin Solid Films |
| Volume | 379 |
| Issue number | 1-2 |
| DOIs | |
| State | Published - 8 Dec 2000 |
Bibliographical note
Funding Information:This work is part of an internal project # CAPS1202, supported by the Research Institute of King Fahd University of Petroleum and Minerals.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry
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