On the Enhanced Surveillance Methods for High-quality Processes

  • Tahir Mahmood*
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Nowadays, processes are equipped with advanced tools; therefore, they produce near zero-defect items and are termed as high-quality processes. The high-quality data often follows the Zero-Inflated Poisson or Negative Binomial (ZIP or ZINB) distributions. In literature, most surveillance methods are designed to monitor ZIP and ZINB distributed quality characteristics. However, some covariates are also available along with the count-based quality characteristics of a process. Therefore, this study is intended to propose moving average (MA) and double MA (DMA) based surveillance methods designed on the ZIP and ZINB residuals (i.e., Pearson). A simulation-based study is carried out to evaluate the performance of proposed methods and their comparative results with an existing method using run-length properties. The findings reveal that the proposed MA and DMA methods outperformed the existing Shewhart chart. Moreover, a real-life example is presented, which supports the simulated results.

Original languageEnglish
Title of host publicationIEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2022
PublisherIEEE Computer Society
Pages369-373
Number of pages5
ISBN (Electronic)9781665486873
DOIs
StatePublished - 2022
Event2022 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2022 - Kuala Lumpur, Malaysia
Duration: 7 Dec 202210 Dec 2022

Publication series

NameIEEE International Conference on Industrial Engineering and Engineering Management
Volume2022-December
ISSN (Print)2157-3611
ISSN (Electronic)2157-362X

Conference

Conference2022 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2022
Country/TerritoryMalaysia
CityKuala Lumpur
Period7/12/2210/12/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

Keywords

  • High-yield Processes
  • Moving Average
  • Statistical Process Control
  • Zero-inflated models

ASJC Scopus subject areas

  • Business, Management and Accounting (miscellaneous)
  • Industrial and Manufacturing Engineering
  • Safety, Risk, Reliability and Quality

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