Abstract
In this study, a Shewhart type control chart, namely (Formula presented.) chart, has been proposed to monitor a process that follows Rayleigh distribution. The proposed (Formula presented.) chart is implemented to monitor the single scale parameter of the Rayleigh distributed process. We have studied the proposed chart under two type of control limits namely probability and (Formula presented.) -sigma limits. The performance of the proposed chart has been assessed by using power function. In addition, we have investigated run length properties including average run length (ARL), standard deviation of run length (SDRL) and median run length (MDRL). The analysis of run length profile reveals that the proposed VR chart outperforms the existing charts including the traditional Shewhart control chart and V control charts under Rayleigh distribution. The construction process for the newly proposed chart has been demonstrated using a simulated data. Finally, a real application of the proposed (Formula presented.) chart, along with the existing (Formula presented.) chart, is presented that evaluates the strength of glass fiber in a manufacturing process.
| Original language | English |
|---|---|
| Pages (from-to) | 3168-3184 |
| Number of pages | 17 |
| Journal | Communications in Statistics Part B: Simulation and Computation |
| Volume | 51 |
| Issue number | 6 |
| DOIs | |
| State | Published - 2022 |
Bibliographical note
Publisher Copyright:© 2020 Taylor & Francis Group, LLC.
Keywords
- Control chart
- Gamma distribution
- Maximum likelihood estimation
- Rayleigh distribution
- Run length
ASJC Scopus subject areas
- Statistics and Probability
- Modeling and Simulation