On-chip pseudorandom testing for linear and nonlinear MEMS

Achraf Dhayni; Salvador Mir; Libor Rufer; Ahcène Bounceur

doi:10.1007/978-0-387-73661-7_16

On-chip pseudorandom testing for linear and nonlinear MEMS

Achraf Dhayni^*, Salvador Mir, Libor Rufer, Ahcène Bounceur

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

In this paper we study the use of pseudorandom test techniques for linear and nonlinear devices, in particular Micro Electro Mechanical Systems (MEMS). These test techniques lead to practical Built-In-Self-Test techniques (BIST). We will first present the pseudorandom test technique for Linear Time Invariant (LTI) systems. Next, we will illustrate and evaluate the application of these techniques for weakly nonlinear, purely nonlinear and strongly nonlinear devices.

Original language	English
Title of host publication	Vlsi-Soc
Subtitle of host publication	From Systems To Silicon: Proceedings of IFIP TC 10, WG 10.5, Thirteenth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2005), October 17-19, 2005, Perth
Editors	Ricardo Reis, Adam Osseiran, Hans-Joerg Pfleiderer
Pages	245-266
Number of pages	22
DOIs	https://doi.org/10.1007/978-0-387-73661-7_16
State	Published - 2007
Externally published	Yes

Publication series

Name	IFIP International Federation for Information Processing
Volume	240
ISSN (Print)	1571-5736

ASJC Scopus subject areas

Information Systems and Management

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10.1007/978-0-387-73661-7_16

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Dhayni, A., Mir, S., Rufer, L., & Bounceur, A. (2007). On-chip pseudorandom testing for linear and nonlinear MEMS. In R. Reis, A. Osseiran, & H.-J. Pfleiderer (Eds.), Vlsi-Soc: From Systems To Silicon: Proceedings of IFIP TC 10, WG 10.5, Thirteenth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2005), October 17-19, 2005, Perth (pp. 245-266). (IFIP International Federation for Information Processing; Vol. 240). https://doi.org/10.1007/978-0-387-73661-7_16

Dhayni, Achraf ; Mir, Salvador ; Rufer, Libor et al. / On-chip pseudorandom testing for linear and nonlinear MEMS. Vlsi-Soc: From Systems To Silicon: Proceedings of IFIP TC 10, WG 10.5, Thirteenth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2005), October 17-19, 2005, Perth. editor / Ricardo Reis ; Adam Osseiran ; Hans-Joerg Pfleiderer. 2007. pp. 245-266 (IFIP International Federation for Information Processing).

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title = "On-chip pseudorandom testing for linear and nonlinear MEMS",

abstract = "In this paper we study the use of pseudorandom test techniques for linear and nonlinear devices, in particular Micro Electro Mechanical Systems (MEMS). These test techniques lead to practical Built-In-Self-Test techniques (BIST). We will first present the pseudorandom test technique for Linear Time Invariant (LTI) systems. Next, we will illustrate and evaluate the application of these techniques for weakly nonlinear, purely nonlinear and strongly nonlinear devices.",

author = "Achraf Dhayni and Salvador Mir and Libor Rufer and Ahc{\`e}ne Bounceur",

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doi = "10.1007/978-0-387-73661-7_16",

language = "English",

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Dhayni, A, Mir, S, Rufer, L & Bounceur, A 2007, On-chip pseudorandom testing for linear and nonlinear MEMS. in R Reis, A Osseiran & H-J Pfleiderer (eds), Vlsi-Soc: From Systems To Silicon: Proceedings of IFIP TC 10, WG 10.5, Thirteenth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2005), October 17-19, 2005, Perth. IFIP International Federation for Information Processing, vol. 240, pp. 245-266. https://doi.org/10.1007/978-0-387-73661-7_16

On-chip pseudorandom testing for linear and nonlinear MEMS. / Dhayni, Achraf; Mir, Salvador; Rufer, Libor et al.
Vlsi-Soc: From Systems To Silicon: Proceedings of IFIP TC 10, WG 10.5, Thirteenth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2005), October 17-19, 2005, Perth. ed. / Ricardo Reis; Adam Osseiran; Hans-Joerg Pfleiderer. 2007. p. 245-266 (IFIP International Federation for Information Processing; Vol. 240).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - In this paper we study the use of pseudorandom test techniques for linear and nonlinear devices, in particular Micro Electro Mechanical Systems (MEMS). These test techniques lead to practical Built-In-Self-Test techniques (BIST). We will first present the pseudorandom test technique for Linear Time Invariant (LTI) systems. Next, we will illustrate and evaluate the application of these techniques for weakly nonlinear, purely nonlinear and strongly nonlinear devices.

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Dhayni A, Mir S, Rufer L, Bounceur A. On-chip pseudorandom testing for linear and nonlinear MEMS. In Reis R, Osseiran A, Pfleiderer HJ, editors, Vlsi-Soc: From Systems To Silicon: Proceedings of IFIP TC 10, WG 10.5, Thirteenth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2005), October 17-19, 2005, Perth. 2007. p. 245-266. (IFIP International Federation for Information Processing). doi: 10.1007/978-0-387-73661-7_16

On-chip pseudorandom testing for linear and nonlinear MEMS

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