New fault models and efficient BIST algorithms for dual-port memories
- Alaaeldin A. Amin*
- , Mohamed Y. Osman
- , Radwan E. Abdel-Aal
- , Husni Al-Muhtaseb
- , A. A. Amin*
- , M. Y. Osman
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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