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New fault models and efficient BIST algorithms for dual-port memories
Alaaeldin A. Amin*, Mohamed Y. Osman, Radwan E. Abdel-Aal, Husni Al-Muhtaseb, A. A. Amin*, M. Y. Osman
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
2
Scopus
citations